Abstract
The developments being made in high performance high performance second generation high temperature superconductors (HTS) were presented. The substrates were polished in a chemical mechanical polishing (CMP) facility, and the surface roughness of the polished substrates was monitored on-line using a laser scatterometer device. The buffer layers obtained were deposited on the polished substrates with ion beam assisted deposition (IBAD) facility, which is modified to achieve uniform texture. From the critical current measurements obtained for every 1m of the tape using a reel-to-reel critical current measuring apparatus, each was found to exhibit a critical current greater than 100A.
Original language | English |
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Article number | EE3.1 |
Pages (from-to) | 29-31 |
Number of pages | 3 |
Journal | Materials Research Society Symposium Proceedings |
Volume | EXS |
Issue number | 3 |
Publication status | Published - 2004 |
Externally published | Yes |
Event | 2003 MRS Fall Meeting - Boston, MA, United States Duration: 2003 Dec 1 → 2003 Dec 4 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering