Reconfigurable ECC for adaptive protection of memory

Abhishek Basak, Somnath Paul, Jangwon Park, Jongsun Park, Swarup Bhunia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Post-silicon healing techniques that rely on built-in redundancy (e.g. row/column redundancy) remain effective in healing manufacturing defects and process variation induced failures in nanoscale memory. They are, however, not effective in improving robustness under various run-time failures. Increasing run-time failures in memory, specifically in case of low-voltage low-power memory, has emerged as a major design challenge. Traditionally, a uniform worst-case protection using Error Correction Code (ECC) is used for all blocks in a large memory array for runt-time error resiliency. However, with both spatial and temporal shift in intrinsic reliability of a memory block, such uniform protection can be unattractive in terms of either ECC overhead or protection level. We propose a novel Reconfigurable ECC approach, which can adapt, in space and time, to varying reliability of memory blocks by using an ECC that can provide the right amount of protection for a memory block at a given time. We show that such an approach is extremely effective in diverse applications.

Original languageEnglish
Title of host publicationMidwest Symposium on Circuits and Systems
Pages1085-1088
Number of pages4
DOIs
Publication statusPublished - 2013 Dec 1
Event2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013 - Columbus, OH, United States
Duration: 2013 Aug 42013 Aug 7

Other

Other2013 IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013
CountryUnited States
CityColumbus, OH
Period13/8/413/8/7

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Basak, A., Paul, S., Park, J., Park, J., & Bhunia, S. (2013). Reconfigurable ECC for adaptive protection of memory. In Midwest Symposium on Circuits and Systems (pp. 1085-1088). [6674841] https://doi.org/10.1109/MWSCAS.2013.6674841