FingerprintDive into the research topics of 'Recovery in dc and rf performance of off-state step-stressed AlGaN/GaN high electron mobility transistors with thermal annealing'. Together they form a unique fingerprint.
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Byung Jae Kim, Ya Hsi Hwang, Shihyun Ahn, Weidi Zhu, Chen Dong, Liu Lu, Fan Ren, M. R. Holzworth, Kevin S. Jones, Stephen J. Pearton, David J. Smith, Jihyun Kim, Ming Lan Zhang
Research output: Contribution to journal › Article › peer-review