Reduction of stacking fault density in m -plane GaN grown on SiC

Y. S. Cho, Q. Sun, I. H. Lee, T. S. Ko, C. D. Yerino, J. Han, B. H. Kong, H. K. Cho, S. Wang

Research output: Contribution to journal › Article › peer-review

56 Citations (Scopus)

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Physics & Astronomy