Reliability of Pb(Mg,Nb)O3-Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method

Jung Hyuk Koh, Tae Geun Kim

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Expected lifetime and reliability of multilayer ceramic actuators were considered. 5 × 5 × 5 mm3 sized multilayer ceramic actuators with 60 ceramic sheet layers embedded internal electrodes were selected in this experimental analysis. Specially selected rectified AC bias was applied to the multilayer ceramic actuators to remove heating during charging and discharging process. Sixteen sets of multilayer ceramic actuators under the different experimental conditions were tested for statistical analysis. Weibull function method was employed to calculate mean time to failure. Arrhenius model and power law model were considered to simulate experimental data. From the experimental data and theoretical consideration, equation of expected lifetime was estimated.

Original languageEnglish
Pages (from-to)183-188
Number of pages6
JournalMicroelectronics Reliability
Volume46
Issue number1
DOIs
Publication statusPublished - 2006 Jan

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Safety, Risk, Reliability and Quality
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Reliability of Pb(Mg,Nb)O<sub>3</sub>-Pb(Zr,Ti)O<sub>3</sub> multilayer ceramic piezoelectric actuators by Weibull method'. Together they form a unique fingerprint.

Cite this