Reliability of Pb(Mg,Nb)O3-Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method

Jung Hyuk Koh, Tae Geun Kim

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Expected lifetime and reliability of multilayer ceramic actuators were considered. 5 × 5 × 5 mm3 sized multilayer ceramic actuators with 60 ceramic sheet layers embedded internal electrodes were selected in this experimental analysis. Specially selected rectified AC bias was applied to the multilayer ceramic actuators to remove heating during charging and discharging process. Sixteen sets of multilayer ceramic actuators under the different experimental conditions were tested for statistical analysis. Weibull function method was employed to calculate mean time to failure. Arrhenius model and power law model were considered to simulate experimental data. From the experimental data and theoretical consideration, equation of expected lifetime was estimated.

Original languageEnglish
Pages (from-to)183-188
Number of pages6
JournalMicroelectronics Reliability
Volume46
Issue number1
DOIs
Publication statusPublished - 2006 Jan 1

Fingerprint

piezoelectric actuators
Piezoelectric actuators
Multilayers
Actuators
ceramics
actuators
life (durability)
Statistical methods
statistical analysis
charging
alternating current
Heating
Electrodes
heating
electrodes

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Reliability of Pb(Mg,Nb)O3-Pb(Zr,Ti)O3 multilayer ceramic piezoelectric actuators by Weibull method. / Koh, Jung Hyuk; Kim, Tae Geun.

In: Microelectronics Reliability, Vol. 46, No. 1, 01.01.2006, p. 183-188.

Research output: Contribution to journalArticle

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