Reliability performance for InGaAsP/InP laser diodes mounted on different sizes of heat blocks in to packages

Hyun Jae Yoon, Nack Jin Chung, Min Ho Choi, In Shik Park, Jichai Jeong

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have estimated the lifetime of InGaAsP/InP laser diodes mounted on different heat block sizes. From an accelerated aging test of laser diodes mounted on the different sizes of heat blocks in TO cans, we have found the difference in the reliability performance. The median normalized degradation ratios (NDRs) of large block (1.4 mm × 1.7 mm2) samples are 1.22%/kh and 0.26%/kh at 40°C for laser diodes from A and B wafers, respectively. For the small block (1.3 mm × 0.9 mm2) samples, the median NDRs are 1.44%/kh and 0.48%/kh for laser diodes from A and B wafers. The reliability performance is better for lasers mounted on the large block samples. The difference in reliability performance due to the heat block size can be explained by developing the heat transfer model. The surface size of heat blocks is the important parameter to retard the degradation process due to the junction temperature difference and then improve reliability performance.

Original languageEnglish
Pages (from-to)1969-1974
Number of pages6
JournalSolid-State Electronics
Volume42
Issue number11
DOIs
Publication statusPublished - 1998 Nov

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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