Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han, Nak Won Yoo, Myung Ha Kim, Byeong Kwon Ju, Min Chul Park

Research output: Contribution to journalArticle

Abstract

We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

Original languageEnglish
Pages (from-to)5883-5891
Number of pages9
JournalApplied optics
Volume58
Issue number22
DOIs
Publication statusPublished - 2019 Aug 1

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform'. Together they form a unique fingerprint.

  • Cite this