Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform

Jeong Heon Han, Nak Won Yoo, Myung Ha Kim, Byeong Kwon Ju, Min Chul Park

Research output: Contribution to journalArticle

Abstract

We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectioned image is mitigated by accurate phase-shifting via the electrical spatial light modulator control signal, which is based on an illumination pattern having a suitable waveform. Reduction in residual modulation is observed in the sinusoidal pattern with a spatial frequency sufficiently below the cutoff frequency of the imaging system. This reduction is larger for the square wave as the spatial frequency approaches one-third of the cutoff frequency.

Original languageEnglish
Pages (from-to)5883-5891
Number of pages9
JournalApplied optics
Volume58
Issue number22
DOIs
Publication statusPublished - 2019 Aug 1

Fingerprint

Cutoff frequency
light modulators
waveforms
Lighting
Modulation
modulation
Imaging systems
cut-off
illumination
square waves
Microscopic examination
Spatial light modulators
microscopy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform. / Han, Jeong Heon; Yoo, Nak Won; Kim, Myung Ha; Ju, Byeong Kwon; Park, Min Chul.

In: Applied optics, Vol. 58, No. 22, 01.08.2019, p. 5883-5891.

Research output: Contribution to journalArticle

Han, Jeong Heon ; Yoo, Nak Won ; Kim, Myung Ha ; Ju, Byeong Kwon ; Park, Min Chul. / Residual modulation reduction in optical sectioning using a suitable spatial light modulator waveform. In: Applied optics. 2019 ; Vol. 58, No. 22. pp. 5883-5891.
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