Response analysis on electrical pulses under severe nuclear accident temperature conditions using an abnormal signal simulation analysis module

Kil Mo Koo, Jin Ho Song, Sang Baik Kim, Kwang Il Ahn, Won Pil Baek, Kil Nam Oh, Gyu Tae Kim

Research output: Contribution to journalArticle

Abstract

Unlike design basis accidents, some inherent uncertainties of the reliability of instrumentations are expected while subjected to harsh environments (e.g., high temperature and pressure, high humidity, and high radioactivity) occurring in severe nuclear accident conditions. Even under such conditions, an electrical signal should be within its expected range so that some mitigating actions can be taken based on the signal in the control room. For example, an industrial process control standard requires that the normal signal level for pressure, flow, and resistance temperature detector sensors be in the range of 4~20mA for most instruments. Whereas, in the case that an abnormal signal is expected from an instrument, such a signal should be refined through a signal validation process so that the refined signal could be available in the control room. For some abnormal signals expected under severe accident conditions, to date, diagnostics and response analysis have been evaluated with an equivalent circuit model of real instruments, which is regarded as the best method. The main objective of this paper is to introduce a program designed to implement a diagnostic and response analysis for equivalent circuit modeling. The program links signal analysis tool code to abnormal signal simulation engine code not only as a one body order system, but also as a part of functions of a PC-based ASSA (abnormal signal simulation analysis) module developed to obtain a varying range of the R-C circuit elements in high temperature conditions. As a result, a special function for abnormal pulse signal patterns can be obtained through the program, which in turn makes it possible to analyze the abnormal output pulse signals through a response characteristic of a 4~20mA circuit model and a range of the elements changing with temperature under an accident condition.

Original languageEnglish
Article number656590
JournalScience and Technology of Nuclear Installations
Volume2012
DOIs
Publication statusPublished - 2012

ASJC Scopus subject areas

  • Nuclear Energy and Engineering

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