The measurements of the forward current-voltage characteristics of both Pt/GaN and Pd/GaN Schottky diodes in N2 and 10% H2 in N2 ambient at different temperatures were presented. It was found that exposure to hydrogen-containing ambients showed a decrease in effective barrier height for both metals relative to the values measured in pure N2 ambients. The analysis showed that magnitude of the changes increased with temperature due to the effective cracking of the H2.
|Number of pages||3|
|Journal||Applied Physics Letters|
|Publication status||Published - 2003 Feb 3|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)