Scanning tunneling microscope study of Sb/Si(111)-5 3√×5√ structure

Kang Ho Park, Jeong Sook Ha, Wan Soo Yun, El Hang Lee, Jae Yel Yi, Seong Ju Park

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We have investigated Sb overlayer structures on Si(111) with low energy electron diffraction and scanning tunneling microscope (STM). The Sb/Si(111)-53√× structure was constructed via the desorption of Sb from the saturated 2×1 surface at elevated temperature (700-750 "C). Its atomic structure and formation process were extensively studied with STM images, considering the structural stability. This Sb structure could be described in terms of the site selective replacement of outermost Si atoms with Sb atoms in the dimer-adatom-stacking fault 5×5 structure, which is generated by both the saturation of dangling bonds and strain due to the large lattice mismatch.

Original languageEnglish
Pages (from-to)1572-1575
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume15
Issue number3
DOIs
Publication statusPublished - 1997 Dec 1
Externally publishedYes

Fingerprint

Microscopes
microscopes
Scanning
Atoms
Lattice mismatch
Dangling bonds
scanning
Adatoms
Low energy electron diffraction
Stacking faults
structural stability
atomic structure
crystal defects
Dimers
adatoms
atoms
Desorption
electron diffraction
desorption
dimers

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Scanning tunneling microscope study of Sb/Si(111)-5 3√×5√ structure. / Park, Kang Ho; Ha, Jeong Sook; Yun, Wan Soo; Lee, El Hang; Yi, Jae Yel; Park, Seong Ju.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 15, No. 3, 01.12.1997, p. 1572-1575.

Research output: Contribution to journalArticle

Park, Kang Ho ; Ha, Jeong Sook ; Yun, Wan Soo ; Lee, El Hang ; Yi, Jae Yel ; Park, Seong Ju. / Scanning tunneling microscope study of Sb/Si(111)-5 3√×5√ structure. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 1997 ; Vol. 15, No. 3. pp. 1572-1575.
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