Schottky-type polycrystalline CdZnTe X-ray detectors

Kihyun Kim, Shin Hang Cho, Jong Hee Suh, Jae Ho Won, Jin Ki Hong, Sun Ung Kim

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The polycrystalline CdZnTe:Cl thick films which have high resistivity about 5 × 109 Ω cm are grown by thermal evaporation method. The leakage currents of as-deposited CdZnTe layers are still too high to operate as medical applications. The blocking layer of Schottky type was formed on the stoichiometric surface of polycrystalline CdZnTe layers to suppress the leakage current of polycrystalline CdZnTe X-ray detectors. The polycrystalline CdZnTe Schottky barrier diodes with indium contact exhibit the low leakage current (14 nA/cm2) at 40 V due to its high barrier height (φ{symbol}b = 0.80 eV). In X-ray image acquisition with Schottky-type linear array polycrystalline CdZnTe X-ray detector, we have obtained the promising results and proved the possibility of polycrystalline CdZnTe for applications as a flat panel X-ray detector.

Original languageEnglish
Pages (from-to)306-310
Number of pages5
JournalCurrent Applied Physics
Volume9
Issue number2
DOIs
Publication statusPublished - 2009 Mar 1

Fingerprint

Leakage currents
Detectors
X rays
leakage
detectors
x rays
Schottky barrier diodes
Thermal evaporation
Image acquisition
Medical applications
linear arrays
Schottky diodes
Thick films
Indium
thick films
indium
acquisition
evaporation
electrical resistivity
CdZnTe

Keywords

  • CdZnTe
  • Leakage current
  • Polycrystalline
  • Schottky diode
  • X-ray detector

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Kim, K., Cho, S. H., Suh, J. H., Won, J. H., Hong, J. K., & Kim, S. U. (2009). Schottky-type polycrystalline CdZnTe X-ray detectors. Current Applied Physics, 9(2), 306-310. https://doi.org/10.1016/j.cap.2008.01.020

Schottky-type polycrystalline CdZnTe X-ray detectors. / Kim, Kihyun; Cho, Shin Hang; Suh, Jong Hee; Won, Jae Ho; Hong, Jin Ki; Kim, Sun Ung.

In: Current Applied Physics, Vol. 9, No. 2, 01.03.2009, p. 306-310.

Research output: Contribution to journalArticle

Kim, K, Cho, SH, Suh, JH, Won, JH, Hong, JK & Kim, SU 2009, 'Schottky-type polycrystalline CdZnTe X-ray detectors', Current Applied Physics, vol. 9, no. 2, pp. 306-310. https://doi.org/10.1016/j.cap.2008.01.020
Kim, Kihyun ; Cho, Shin Hang ; Suh, Jong Hee ; Won, Jae Ho ; Hong, Jin Ki ; Kim, Sun Ung. / Schottky-type polycrystalline CdZnTe X-ray detectors. In: Current Applied Physics. 2009 ; Vol. 9, No. 2. pp. 306-310.
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