Screening current-induced field in non-insulated GdBCO pancake coil

D. G. Yang, K. L. Kim, Y. H. Choi, O. J. Kwon, Y. J. Park, Haigun Lee

Research output: Contribution to journalArticle

30 Citations (Scopus)

Abstract

In this study, empirical and numerical analyses on the screening current-induced field (SCIF) characteristics of a non-insulated (NI) GdBCO-coated conductor single-pancake coil were conducted. Charge and discharge tests were carried out to induce an SCIF in the NI test coil. The SCIF in the NI coil was identified by comparison between the measured and calculated magnetic fields. The experimental results exhibit an increase of the SCIF with increasing an operating current, as well as a logarithmic decay of the SCIF as a function of time. Moreover, the SCIF was not affected by the slow discharge of the NI coil. The estimation of the SCIF based on the critical-state model in a thin film using the finite element method was in fairly good agreement with the experimental results.

Original languageEnglish
Article number105025
JournalSuperconductor Science and Technology
Volume26
Issue number10
DOIs
Publication statusPublished - 2013 Oct 1

Fingerprint

Induced currents
Screening
coils
screening
finite element method
Magnetic fields
conductors
Finite element method
Thin films
decay
thin films
magnetic fields

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Ceramics and Composites
  • Materials Chemistry
  • Metals and Alloys

Cite this

Screening current-induced field in non-insulated GdBCO pancake coil. / Yang, D. G.; Kim, K. L.; Choi, Y. H.; Kwon, O. J.; Park, Y. J.; Lee, Haigun.

In: Superconductor Science and Technology, Vol. 26, No. 10, 105025, 01.10.2013.

Research output: Contribution to journalArticle

Yang, D. G. ; Kim, K. L. ; Choi, Y. H. ; Kwon, O. J. ; Park, Y. J. ; Lee, Haigun. / Screening current-induced field in non-insulated GdBCO pancake coil. In: Superconductor Science and Technology. 2013 ; Vol. 26, No. 10.
@article{4e7c5f0166e740c2adaf03dc6dbe0399,
title = "Screening current-induced field in non-insulated GdBCO pancake coil",
abstract = "In this study, empirical and numerical analyses on the screening current-induced field (SCIF) characteristics of a non-insulated (NI) GdBCO-coated conductor single-pancake coil were conducted. Charge and discharge tests were carried out to induce an SCIF in the NI test coil. The SCIF in the NI coil was identified by comparison between the measured and calculated magnetic fields. The experimental results exhibit an increase of the SCIF with increasing an operating current, as well as a logarithmic decay of the SCIF as a function of time. Moreover, the SCIF was not affected by the slow discharge of the NI coil. The estimation of the SCIF based on the critical-state model in a thin film using the finite element method was in fairly good agreement with the experimental results.",
author = "Yang, {D. G.} and Kim, {K. L.} and Choi, {Y. H.} and Kwon, {O. J.} and Park, {Y. J.} and Haigun Lee",
year = "2013",
month = "10",
day = "1",
doi = "10.1088/0953-2048/26/10/105025",
language = "English",
volume = "26",
journal = "Superconductor Science and Technology",
issn = "0953-2048",
publisher = "IOP Publishing Ltd.",
number = "10",

}

TY - JOUR

T1 - Screening current-induced field in non-insulated GdBCO pancake coil

AU - Yang, D. G.

AU - Kim, K. L.

AU - Choi, Y. H.

AU - Kwon, O. J.

AU - Park, Y. J.

AU - Lee, Haigun

PY - 2013/10/1

Y1 - 2013/10/1

N2 - In this study, empirical and numerical analyses on the screening current-induced field (SCIF) characteristics of a non-insulated (NI) GdBCO-coated conductor single-pancake coil were conducted. Charge and discharge tests were carried out to induce an SCIF in the NI test coil. The SCIF in the NI coil was identified by comparison between the measured and calculated magnetic fields. The experimental results exhibit an increase of the SCIF with increasing an operating current, as well as a logarithmic decay of the SCIF as a function of time. Moreover, the SCIF was not affected by the slow discharge of the NI coil. The estimation of the SCIF based on the critical-state model in a thin film using the finite element method was in fairly good agreement with the experimental results.

AB - In this study, empirical and numerical analyses on the screening current-induced field (SCIF) characteristics of a non-insulated (NI) GdBCO-coated conductor single-pancake coil were conducted. Charge and discharge tests were carried out to induce an SCIF in the NI test coil. The SCIF in the NI coil was identified by comparison between the measured and calculated magnetic fields. The experimental results exhibit an increase of the SCIF with increasing an operating current, as well as a logarithmic decay of the SCIF as a function of time. Moreover, the SCIF was not affected by the slow discharge of the NI coil. The estimation of the SCIF based on the critical-state model in a thin film using the finite element method was in fairly good agreement with the experimental results.

UR - http://www.scopus.com/inward/record.url?scp=84884795038&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84884795038&partnerID=8YFLogxK

U2 - 10.1088/0953-2048/26/10/105025

DO - 10.1088/0953-2048/26/10/105025

M3 - Article

VL - 26

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

SN - 0953-2048

IS - 10

M1 - 105025

ER -