Seed-layer mediated orientation evolution in dielectric Bi-Zn-Ti-Nb-O thin films

Jin Young Kim, Jun Hong Noh, Sangwook Lee, Sung Hun Yoon, Chin Moo Cho, Kug Sun Hong, Hyun Suk Jung, Jung Kun Lee

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Highly (hhh) -oriented pyrochlore Bi-Zn-Ti-Nb-O (BZTN) thin films were fabricated via metal-organic decomposition using orientation template layers. The preferred orientation was ascribed to the interfacial layer, the lattice parameter of which is similar to BZTN. High-resolution transmission electron microscopy supported that the interfacial layer consists of Bi and Pt. The (hhh) -oriented thin films exhibited a highly insulating nature enabling feasible applications in electronic devices, particularly voltage tunable application. The BZTN thin films did not show any apparent dielectric anisotropy and the slightly enhanced dielectric properties were discussed in connection to the internal stress and the grain boundary effect.

Original languageEnglish
Article number232903
JournalApplied Physics Letters
Volume91
Issue number23
DOIs
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Seed-layer mediated orientation evolution in dielectric Bi-Zn-Ti-Nb-O thin films'. Together they form a unique fingerprint.

  • Cite this

    Kim, J. Y., Noh, J. H., Lee, S., Yoon, S. H., Cho, C. M., Hong, K. S., Jung, H. S., & Lee, J. K. (2007). Seed-layer mediated orientation evolution in dielectric Bi-Zn-Ti-Nb-O thin films. Applied Physics Letters, 91(23), [232903]. https://doi.org/10.1063/1.2806193