Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope

Kang Ho Park; Jeong Sook Ha; Wan Soo Yun; Young Jo Ko

doi:10.1143/jjap.39.4629

Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope

Kang Ho Park, Jeong Sook Ha, Wan Soo Yun, Young Jo Ko

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

A precise nanofabrication method using a scanning tunneling microscope (STM) tip as nanoscale tweezers was devised. With the aid of surface passivation by Sb, we could form Ag nanoclusters on a Si(100) surface. It was found that self-organized Ag clusters can be selectively detached and manipulated at room temperature by field application because of the weak bonding strength between the clusters and an Sb-terminated Si surface.

Original language	English
Pages (from-to)	4629-4630
Number of pages	2
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	39
Issue number	7 B
DOIs	https://doi.org/10.1143/jjap.39.4629
Publication status	Published - 2000
Externally published	Yes

Keywords

Ag
Nanoclusters
Nanofabrication
Passivation
Sb
Scanning tunneling microscope
Si(100)

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/jjap.39.4629

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Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope. / Park, Kang Ho; Ha, Jeong Sook; Yun, Wan Soo et al.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 39, No. 7 B, 2000, p. 4629-4630.

Research output: Contribution to journal › Article › peer-review

@article{4439a3b0adb44ae49051855014d84dcc,

title = "Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope",

abstract = "A precise nanofabrication method using a scanning tunneling microscope (STM) tip as nanoscale tweezers was devised. With the aid of surface passivation by Sb, we could form Ag nanoclusters on a Si(100) surface. It was found that self-organized Ag clusters can be selectively detached and manipulated at room temperature by field application because of the weak bonding strength between the clusters and an Sb-terminated Si surface.",

keywords = "Ag, Nanoclusters, Nanofabrication, Passivation, Sb, Scanning tunneling microscope, Si(100)",

author = "Park, {Kang Ho} and Ha, {Jeong Sook} and Yun, {Wan Soo} and Ko, {Young Jo}",

year = "2000",

doi = "10.1143/jjap.39.4629",

language = "English",

volume = "39",

pages = "4629--4630",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "7 B",

}

TY - JOUR

T1 - Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope

AU - Park, Kang Ho

AU - Ha, Jeong Sook

AU - Yun, Wan Soo

AU - Ko, Young Jo

PY - 2000

Y1 - 2000

N2 - A precise nanofabrication method using a scanning tunneling microscope (STM) tip as nanoscale tweezers was devised. With the aid of surface passivation by Sb, we could form Ag nanoclusters on a Si(100) surface. It was found that self-organized Ag clusters can be selectively detached and manipulated at room temperature by field application because of the weak bonding strength between the clusters and an Sb-terminated Si surface.

AB - A precise nanofabrication method using a scanning tunneling microscope (STM) tip as nanoscale tweezers was devised. With the aid of surface passivation by Sb, we could form Ag nanoclusters on a Si(100) surface. It was found that self-organized Ag clusters can be selectively detached and manipulated at room temperature by field application because of the weak bonding strength between the clusters and an Sb-terminated Si surface.

KW - Ag

KW - Nanoclusters

KW - Nanofabrication

KW - Passivation

KW - Sb

KW - Scanning tunneling microscope

KW - Si(100)

UR - http://www.scopus.com/inward/record.url?scp=0034227392&partnerID=8YFLogxK

U2 - 10.1143/jjap.39.4629

DO - 10.1143/jjap.39.4629

M3 - Article

AN - SCOPUS:0034227392

SN - 0021-4922

VL - 39

SP - 4629

EP - 4630

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

IS - 7 B

ER -

Selective manipulation of Ag nanoclusters on a passivated silicon surface using a scanning tunneling microscope

Abstract

Keywords

ASJC Scopus subject areas

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