SEQM

Edge quality assessment based on structural pixel matching

Won Dong Jang, Chang-Su Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

A novel quality metric for binary edge maps, called the structural edge quality metric (SEQM), is proposed in this work. First, we define the matching cost between an edge pixel in a detected edge map and its candidate matching pixel in the ground-truth edge map. The matching cost includes a structural term, as well as a positional term, to measure the discrepancy between the local structures around the two pixels. Then, we determine the optimal matching pairs of pixels using the graph-cut optimization, in which a smoothness term is employed to take into account global edge structures in the matching. Finally, we sum up the matching costs of all edge pixels to determine the quality index of the detected edge map. Simulation results demonstrate that the proposed SEQM provides more faithful and reliable quality indices than conventional metrics.

Original languageEnglish
Title of host publication2012 IEEE Visual Communications and Image Processing, VCIP 2012
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE Visual Communications and Image Processing, VCIP 2012 - San Diego, CA, United States
Duration: 2012 Nov 272012 Nov 30

Other

Other2012 IEEE Visual Communications and Image Processing, VCIP 2012
CountryUnited States
CitySan Diego, CA
Period12/11/2712/11/30

Fingerprint

Pixels
Costs

Keywords

  • binary edge map
  • edge quality assessment
  • Image quality assessment
  • pixel matching
  • structural similarity

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

Cite this

Jang, W. D., & Kim, C-S. (2012). SEQM: Edge quality assessment based on structural pixel matching. In 2012 IEEE Visual Communications and Image Processing, VCIP 2012 [6410731] https://doi.org/10.1109/VCIP.2012.6410731

SEQM : Edge quality assessment based on structural pixel matching. / Jang, Won Dong; Kim, Chang-Su.

2012 IEEE Visual Communications and Image Processing, VCIP 2012. 2012. 6410731.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jang, WD & Kim, C-S 2012, SEQM: Edge quality assessment based on structural pixel matching. in 2012 IEEE Visual Communications and Image Processing, VCIP 2012., 6410731, 2012 IEEE Visual Communications and Image Processing, VCIP 2012, San Diego, CA, United States, 12/11/27. https://doi.org/10.1109/VCIP.2012.6410731
Jang WD, Kim C-S. SEQM: Edge quality assessment based on structural pixel matching. In 2012 IEEE Visual Communications and Image Processing, VCIP 2012. 2012. 6410731 https://doi.org/10.1109/VCIP.2012.6410731
Jang, Won Dong ; Kim, Chang-Su. / SEQM : Edge quality assessment based on structural pixel matching. 2012 IEEE Visual Communications and Image Processing, VCIP 2012. 2012.
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