Sequential locally optimum test (SLOT): A sequential detection scheme based on locally optimum test statistic

Jinsoo Bae, Seong Ill Park, Yunhee Kim, Seokho Yoon, Jongho Oh, Iickho Song, Seong Jun Oh

Research output: Contribution to journalArticle

Abstract

Based on the characteristics of the thresholds of two detectionschemes employing locally optimum test statistics, a sequential detection design procedure is proposed and analyzed. The proposed sequential test, called the sequential locally optimum test (SLOT), inherently provides finite stopping time (terminates with probability one within the finite horizon), and thereby avoids undesirable forced termination. The performance of the SLOT is compared with that of the fixed sample-size test, sequential probability ratio test (SPRT), truncated SPRT, and 2-SPRT. It is observed that the SLOT requires smaller average sample numbers than other schemes at most values of the normalized signal amplitude while maintaining the error performance close to the SPRT.

Original languageEnglish
Pages (from-to)2045-2056
Number of pages12
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE93-A
Issue number11
DOIs
Publication statusPublished - 2010 Nov

Keywords

  • Asymptotic sample number
  • Locally optimum detector
  • Minimum false-alarm
  • Sequential probability ratio test
  • Sequential test

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

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