Short channel mobility analysis of SiGe nanowire p-type field effect transistors: Origins of the strain induced performance improvement

Jae Woo Lee, Doyoung Jang, Mireille Mouis, Kiichi Tachi, Gyu Tae Kim, Thomas Ernst, Gérard Ghibaudo

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

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Physics & Astronomy