SiGe HBT performance limits

Greg Freeman, Andreas Stricker, David R. Greenberg, Jae-Sung Rieh

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationSilicon Heterostructure Handbook
Subtitle of host publicationMaterials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy
PublisherCRC Press
Pages4.14-571-4.14-582
ISBN (Electronic)9781420026580
ISBN (Print)9780849335594
Publication statusPublished - 2005 Jan 1

ASJC Scopus subject areas

  • Engineering(all)
  • Environmental Science(all)
  • Materials Science(all)

Cite this

Freeman, G., Stricker, A., Greenberg, D. R., & Rieh, J-S. (2005). SiGe HBT performance limits. In Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy (pp. 4.14-571-4.14-582). CRC Press.