Abstract
We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
| Original language | English |
|---|---|
| Pages (from-to) | 303-309 |
| Number of pages | 7 |
| Journal | Optics Communications |
| Volume | 173 |
| Issue number | 1-6 |
| DOIs | |
| Publication status | Published - 2000 Jan 1 |
| Externally published | Yes |
Fingerprint
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
Cite this
Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes. / Shin, Yun Sup; Yoon, Tai Hyun; Park, Jong Rak; Nam, Chang Hee.
In: Optics Communications, Vol. 173, No. 1-6, 01.01.2000, p. 303-309.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes
AU - Shin, Yun Sup
AU - Yoon, Tai Hyun
AU - Park, Jong Rak
AU - Nam, Chang Hee
PY - 2000/1/1
Y1 - 2000/1/1
N2 - We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
AB - We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
UR - http://www.scopus.com/inward/record.url?scp=0033892060&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0033892060&partnerID=8YFLogxK
U2 - 10.1016/S0030-4018(99)00589-1
DO - 10.1016/S0030-4018(99)00589-1
M3 - Article
AN - SCOPUS:0033892060
VL - 173
SP - 303
EP - 309
JO - Optics Communications
JF - Optics Communications
SN - 0030-4018
IS - 1-6
ER -