TY - JOUR
T1 - Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes
AU - Shin, Yun Sup
AU - Yoon, Tai Hyun
AU - Park, Jong Rak
AU - Nam, Chang Hee
N1 - Funding Information:
This research was supported in part by the Korea Research Institute of Standards and Science under Contract. No. KRISS-98-0401-005. One of the authors (Y.S.S.) gratefully acknowledges Mr. K. Okumura and Dr. A. Onae of NRLM, Japan, for their advice and help.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2000/1
Y1 - 2000/1
N2 - We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
AB - We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.
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U2 - 10.1016/S0030-4018(99)00589-1
DO - 10.1016/S0030-4018(99)00589-1
M3 - Article
AN - SCOPUS:0033892060
VL - 173
SP - 303
EP - 309
JO - Optics Communications
JF - Optics Communications
SN - 0030-4018
IS - 1-6
ER -