Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes

Yun Sup Shin, Tai Hyun Yoon, Jong Rak Park, Chang Hee Nam

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We introduce two simple methods, a current scanning method and a reflectivity scanning method, for measuring the linewidth enhancement factor (α) in an external cavity laser diode (ECLD). Both methods utilize the functional relationship associated with α between the emission wavelength and effective reflectivity of the compound cavity of ECLD. The change of emission wavelength as a function of an injection current and of an external reflectivity is used to determine the value of α in the current scanning method and in the reflectivity scanning method, respectively. The measured values of α by the two methods showed a fairly good agreement.

Original languageEnglish
Pages (from-to)303-309
Number of pages7
JournalOptics Communications
Volume173
Issue number1-6
DOIs
Publication statusPublished - 2000 Jan 1
Externally publishedYes

Fingerprint

Linewidth
Semiconductor lasers
semiconductor lasers
Scanning
reflectance
cavities
scanning
augmentation
Wavelength
wavelengths
injection

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes. / Shin, Yun Sup; Yoon, Tai Hyun; Park, Jong Rak; Nam, Chang Hee.

In: Optics Communications, Vol. 173, No. 1-6, 01.01.2000, p. 303-309.

Research output: Contribution to journalArticle

Shin, Yun Sup ; Yoon, Tai Hyun ; Park, Jong Rak ; Nam, Chang Hee. / Simple methods for measuring the linewidth enhancement factor in external cavity laser diodes. In: Optics Communications. 2000 ; Vol. 173, No. 1-6. pp. 303-309.
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