Simplified static analysis for shock behavior evaluation of thin glass plates

Seong In Moon, Chang Hoi Kim, J. C. Koo, Jae Boong Choi, Young Jin Kim, Yun-Jae Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, mechanical shock failures of a flat display unit such as TFT-LCD device have been an important concern of designers. In order to achieve the mechanical shock requirement, it is necessary to perform the detailed FE analyses which could be very expensive either by the lengthy computation or by the complicated geometry modeling. The objective of this study is to propose a simplified analysis methodology to simulate impact behavior of thin glass plates. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress under impact loading. To show the plausibility of the proposed approach, it is applied to the idealized problem which is a two dimensional beam subjected to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, it was shown that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Therefore, the proposed approach provides significant advantages in design optimization of a TFT-LCD device against shock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened.

Original languageEnglish
Title of host publicationSolid State Phenomena
PublisherTrans Tech Publications Ltd
Pages263-270
Number of pages8
Volume110
ISBN (Print)9783908451150
DOIs
Publication statusPublished - 2006
EventInternational Symposium on Safety and Structural Integrity, 2005 - Singapore, Singapore
Duration: 2005 Jan 172005 Jan 20

Publication series

NameSolid State Phenomena
Volume110
ISSN (Electronic)16629779

Other

OtherInternational Symposium on Safety and Structural Integrity, 2005
CountrySingapore
CitySingapore
Period05/1/1705/1/20

Fingerprint

Static analysis
Liquid crystal displays
shock
Glass
mechanical shock
evaluation
glass
Product design
Mechanics
Display devices
Geometry
solid mechanics
design optimization
deflection
methodology
requirements
cycles
estimates
products
geometry

Keywords

  • Energy
  • Impact Analysis
  • Static Analysis
  • TFT-LCD

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics

Cite this

Moon, S. I., Kim, C. H., Koo, J. C., Choi, J. B., Kim, Y. J., & Kim, Y-J. (2006). Simplified static analysis for shock behavior evaluation of thin glass plates. In Solid State Phenomena (Vol. 110, pp. 263-270). (Solid State Phenomena; Vol. 110). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/SSP.110.263

Simplified static analysis for shock behavior evaluation of thin glass plates. / Moon, Seong In; Kim, Chang Hoi; Koo, J. C.; Choi, Jae Boong; Kim, Young Jin; Kim, Yun-Jae.

Solid State Phenomena. Vol. 110 Trans Tech Publications Ltd, 2006. p. 263-270 (Solid State Phenomena; Vol. 110).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Moon, SI, Kim, CH, Koo, JC, Choi, JB, Kim, YJ & Kim, Y-J 2006, Simplified static analysis for shock behavior evaluation of thin glass plates. in Solid State Phenomena. vol. 110, Solid State Phenomena, vol. 110, Trans Tech Publications Ltd, pp. 263-270, International Symposium on Safety and Structural Integrity, 2005, Singapore, Singapore, 05/1/17. https://doi.org/10.4028/www.scientific.net/SSP.110.263
Moon SI, Kim CH, Koo JC, Choi JB, Kim YJ, Kim Y-J. Simplified static analysis for shock behavior evaluation of thin glass plates. In Solid State Phenomena. Vol. 110. Trans Tech Publications Ltd. 2006. p. 263-270. (Solid State Phenomena). https://doi.org/10.4028/www.scientific.net/SSP.110.263
Moon, Seong In ; Kim, Chang Hoi ; Koo, J. C. ; Choi, Jae Boong ; Kim, Young Jin ; Kim, Yun-Jae. / Simplified static analysis for shock behavior evaluation of thin glass plates. Solid State Phenomena. Vol. 110 Trans Tech Publications Ltd, 2006. pp. 263-270 (Solid State Phenomena).
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