Simulation methodology for 2D random network of CNTs field-effect transistors

Min Kyu Joo, Mireille Mouis, Gyu Tae Kim, Un Jeong Kim, Gerard Ghibaudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Two-dimensional (2D) random networks of carbon nanotubes (RN-CNTs) were simulated with respect to various geometry factors and compared with experimental results. To determine the effective current-conducting pathway(s) in such complex RN-CNTs, we developed a methodology to find the optimal percolation paths with account for the conduction length (ld) of each CNT segment involved, for properties of the junction between CNTs and for series resistance (Rsd) at contacts. Moreover, to investigate linear and non-linear operation of RN-CNT FETs, SPICE circuit simulation was employed.

Original languageEnglish
Title of host publicationULIS 2013
Subtitle of host publicationThe 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'
Pages197-200
Number of pages4
DOIs
Publication statusPublished - 2013
Event14th International Conference on Ultimate Integration on Silicon, ULIS 2013 - Coventry, United Kingdom
Duration: 2013 Mar 192013 Mar 21

Publication series

NameULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'

Other

Other14th International Conference on Ultimate Integration on Silicon, ULIS 2013
CountryUnited Kingdom
CityCoventry
Period13/3/1913/3/21

Keywords

  • Carbon nanotube (CNT)
  • SPICE simulation
  • percolation theory
  • sensor applications

ASJC Scopus subject areas

  • Hardware and Architecture

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  • Cite this

    Joo, M. K., Mouis, M., Kim, G. T., Kim, U. J., & Ghibaudo, G. (2013). Simulation methodology for 2D random network of CNTs field-effect transistors. In ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day' (pp. 197-200). [6523518] (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'). https://doi.org/10.1109/ULIS.2013.6523518