Simulation of single-electron/CMOS hybrid circuits using SPICE macro-modeling

Y. S. Yu, Y. I. Jung, Jung ho Park, S. W. Hwang, D. Ahn

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The macro-modeling technique of single electron transistors has been applied to the SPICE simulation of single-electron/CMOS hybrid circuits. Several hybrid circuits such as an SET-NMOS pair and a single electron NOR-gate with CMOS buffers have been simulated and efficient interface characteristics have been demonstrated. This technique is simple to perform and does not require any modification of the SPICE internal source code.

Original languageEnglish
JournalJournal of the Korean Physical Society
Volume35
Issue numberSUPPL. 4
Publication statusPublished - 1999 Dec 1

Fingerprint

hybrid circuits
CMOS
single electron transistors
electrons
simulation
buffers

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Simulation of single-electron/CMOS hybrid circuits using SPICE macro-modeling. / Yu, Y. S.; Jung, Y. I.; Park, Jung ho; Hwang, S. W.; Ahn, D.

In: Journal of the Korean Physical Society, Vol. 35, No. SUPPL. 4, 01.12.1999.

Research output: Contribution to journalArticle

Yu, Y. S. ; Jung, Y. I. ; Park, Jung ho ; Hwang, S. W. ; Ahn, D. / Simulation of single-electron/CMOS hybrid circuits using SPICE macro-modeling. In: Journal of the Korean Physical Society. 1999 ; Vol. 35, No. SUPPL. 4.
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