Simulation studies of domain wall width changes in various nanocontact shapes

Young-geun Kim, S. Kim, B. Chun, D. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG 2006 - IEEE International Magnetics Conference
Pages615
Number of pages1
DOIs
Publication statusPublished - 2006
EventINTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States
Duration: 2006 May 82006 May 12

Other

OtherINTERMAG 2006 - IEEE International Magnetics Conference
CountryUnited States
CitySan Diego, CA
Period06/5/806/5/12

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Domain walls

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Kim, Y., Kim, S., Chun, B., & Kim, D. (2006). Simulation studies of domain wall width changes in various nanocontact shapes. In INTERMAG 2006 - IEEE International Magnetics Conference (pp. 615). [4262048] https://doi.org/10.1109/INTMAG.2006.376339

Simulation studies of domain wall width changes in various nanocontact shapes. / Kim, Young-geun; Kim, S.; Chun, B.; Kim, D.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. p. 615 4262048.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, Y, Kim, S, Chun, B & Kim, D 2006, Simulation studies of domain wall width changes in various nanocontact shapes. in INTERMAG 2006 - IEEE International Magnetics Conference., 4262048, pp. 615, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06/5/8. https://doi.org/10.1109/INTMAG.2006.376339
Kim Y, Kim S, Chun B, Kim D. Simulation studies of domain wall width changes in various nanocontact shapes. In INTERMAG 2006 - IEEE International Magnetics Conference. 2006. p. 615. 4262048 https://doi.org/10.1109/INTMAG.2006.376339
Kim, Young-geun ; Kim, S. ; Chun, B. ; Kim, D. / Simulation studies of domain wall width changes in various nanocontact shapes. INTERMAG 2006 - IEEE International Magnetics Conference. 2006. pp. 615
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