Single Image Dehazing Based on Weighted Dark Channel

Hong Kyu Shin, Joon Yeon Kim, Han Kyu Lee, Sung-Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Most single image dehazing methods are based on the dark channel prior. However, since the use of the dark channel prior results in halo artifacts, these conventional dehazing methods employ computationally complex post-refinement processes to eliminate the halo artifacts. In this paper, we propose a single image dehazing method using a weighted dark channel that does not require any post-refinement process. Unlike the conventional dark channel obtained by selecting the minimum intensity value in the local patch, the weighted dark channel is generated by considering the color similarity and spatial distance in the local patch. Experimental results show that the proposed method does not only remove the haze effectively, but also prevent the halo artifacts.

Original languageEnglish
Title of host publication2019 IEEE International Conference on Consumer Electronics, ICCE 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538679104
DOIs
Publication statusPublished - 2019 Mar 6
Event2019 IEEE International Conference on Consumer Electronics, ICCE 2019 - Las Vegas, United States
Duration: 2019 Jan 112019 Jan 13

Publication series

Name2019 IEEE International Conference on Consumer Electronics, ICCE 2019

Conference

Conference2019 IEEE International Conference on Consumer Electronics, ICCE 2019
CountryUnited States
CityLas Vegas
Period19/1/1119/1/13

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Media Technology
  • Electrical and Electronic Engineering

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  • Cite this

    Shin, H. K., Kim, J. Y., Lee, H. K., & Ko, S-J. (2019). Single Image Dehazing Based on Weighted Dark Channel. In 2019 IEEE International Conference on Consumer Electronics, ICCE 2019 [8662091] (2019 IEEE International Conference on Consumer Electronics, ICCE 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE.2019.8662091