Single-shot Full-field reflection phase microscopy

Zahid Yaqoob, Toyohiko Yamauchi, Wonshik Choi, Dan Fu, Ramachandra R. Dasari, Michael S. Fel

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

We present a full-field reflection phase microscope that combines low-coherence interferometry and off-axis digital holographic microscopy (DHM). The reflection-based DHM provides highly sensitive and a single-shot imaging of cellular dynamics while the use of low coherence source provides a depth-selective measurement. The setup uniquely uses a diffraction grating in the reference arm to generate an interference image of uniform contrast over the entire field-of-view albeit low-coherence light source. We have measured the path-length sensitivity of our instrument to be approximately 21 picometers Hz that makes it suitable for nanometer-scale full-field measurement of membrane dynamics in live cells.

Original languageEnglish
Pages (from-to)7587-7595
Number of pages9
JournalOptics Express
Volume19
Issue number8
DOIs
Publication statusPublished - 2011 Apr 11

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shot
microscopy
gratings (spectra)
field of view
light sources
interferometry
microscopes
membranes
interference
sensitivity
cells

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Yaqoob, Z., Yamauchi, T., Choi, W., Fu, D., Dasari, R. R., & Fel, M. S. (2011). Single-shot Full-field reflection phase microscopy. Optics Express, 19(8), 7587-7595. https://doi.org/10.1364/OE.19.007587

Single-shot Full-field reflection phase microscopy. / Yaqoob, Zahid; Yamauchi, Toyohiko; Choi, Wonshik; Fu, Dan; Dasari, Ramachandra R.; Fel, Michael S.

In: Optics Express, Vol. 19, No. 8, 11.04.2011, p. 7587-7595.

Research output: Contribution to journalArticle

Yaqoob, Z, Yamauchi, T, Choi, W, Fu, D, Dasari, RR & Fel, MS 2011, 'Single-shot Full-field reflection phase microscopy', Optics Express, vol. 19, no. 8, pp. 7587-7595. https://doi.org/10.1364/OE.19.007587
Yaqoob Z, Yamauchi T, Choi W, Fu D, Dasari RR, Fel MS. Single-shot Full-field reflection phase microscopy. Optics Express. 2011 Apr 11;19(8):7587-7595. https://doi.org/10.1364/OE.19.007587
Yaqoob, Zahid ; Yamauchi, Toyohiko ; Choi, Wonshik ; Fu, Dan ; Dasari, Ramachandra R. ; Fel, Michael S. / Single-shot Full-field reflection phase microscopy. In: Optics Express. 2011 ; Vol. 19, No. 8. pp. 7587-7595.
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