Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application

Jabeom Koo, Gil Su Kim, Junyoung Song, Kwan Weon Kim, Young Jung Choi, Chulwoo Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The proposed on-die termination (ODT) calibration method is implemented by using a 0.18um CMOS technology. The proposed ODT can detect the impedance variations of each ODT/OCD independently with the help of the proposed local PVT variation sensor and can decrease the impedance mismatch error lower than 1% by calibration of global on-chip variation with small area overhead. The measured eye diagram area at 2Gbps is widened by 26% when the ODT is on. The random data rate used for testing the eye diagram is 2Gbps. The global impedance mismatch error is within 1% under the supply voltage variation from 1.7V to 1.9V. The ODT and its calibration circuit occupy 0.003mm 2 and 0.015mm 2, respectively. The power consumption of the calibration circuit is 10mW at 2Gbps.

Original languageEnglish
Title of host publicationProceedings of the Custom Integrated Circuits Conference
Pages717-720
Number of pages4
DOIs
Publication statusPublished - 2009 Dec 1
Event2009 IEEE Custom Integrated Circuits Conference, CICC '09 - San Jose, CA, United States
Duration: 2009 Sep 132009 Sep 16

Other

Other2009 IEEE Custom Integrated Circuits Conference, CICC '09
CountryUnited States
CitySan Jose, CA
Period09/9/1309/9/16

Fingerprint

Calibration
Networks (circuits)
Electric power utilization
Sensors
Testing
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Koo, J., Kim, G. S., Song, J., Kim, K. W., Choi, Y. J., & Kim, C. (2009). Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application. In Proceedings of the Custom Integrated Circuits Conference (pp. 717-720). [5280735] https://doi.org/10.1109/CICC.2009.5280735

Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application. / Koo, Jabeom; Kim, Gil Su; Song, Junyoung; Kim, Kwan Weon; Choi, Young Jung; Kim, Chulwoo.

Proceedings of the Custom Integrated Circuits Conference. 2009. p. 717-720 5280735.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Koo, J, Kim, GS, Song, J, Kim, KW, Choi, YJ & Kim, C 2009, Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application. in Proceedings of the Custom Integrated Circuits Conference., 5280735, pp. 717-720, 2009 IEEE Custom Integrated Circuits Conference, CICC '09, San Jose, CA, United States, 09/9/13. https://doi.org/10.1109/CICC.2009.5280735
Koo J, Kim GS, Song J, Kim KW, Choi YJ, Kim C. Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application. In Proceedings of the Custom Integrated Circuits Conference. 2009. p. 717-720. 5280735 https://doi.org/10.1109/CICC.2009.5280735
Koo, Jabeom ; Kim, Gil Su ; Song, Junyoung ; Kim, Kwan Weon ; Choi, Young Jung ; Kim, Chulwoo. / Small-area high-accuracy ODT/OCD by calibration of global on-chip for 512M GDDR5 application. Proceedings of the Custom Integrated Circuits Conference. 2009. pp. 717-720
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