Small signal measurement of Sc2O3 AlGaN/GaN moshemts

B. Luo, R. Mehandru, B. S. Kang, Ji Hyun Kim, F. Ren, B. P. Gila, A. H. Onstine, C. R. Abernathy, S. J. Pearton, D. Gotthold, R. Birkhahn, B. Peres, R. Fitch, J. K. Gillespie, T. Jenkins, J. Sewell, D. Via, A. Crespo

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Abstract

The rf performance of 1 × 200 μm2 AlGaN/GaN MOS-HEMTs with Sc2O3 used as both the gate dielectric and as a surface passivation layer is reported. A maximum fT of ∼ 11 GHz and fMAX of 19 GHz were obtained. The equivalent device parameters were extracted by fitting this data to obtain the transconductance, drain resistance, drain-source resistance, transfer time and gate-drain and gate-source capacitance as a function of gate voltage. The transfer time is in the order 0.5-1 ps and decreases with increasing gate voltage.

Original languageEnglish
Pages (from-to)355-358
Number of pages4
JournalSolid-State Electronics
Volume48
Issue number2
DOIs
Publication statusPublished - 2004 Feb 1
Externally publishedYes

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Luo, B., Mehandru, R., Kang, B. S., Kim, J. H., Ren, F., Gila, B. P., Onstine, A. H., Abernathy, C. R., Pearton, S. J., Gotthold, D., Birkhahn, R., Peres, B., Fitch, R., Gillespie, J. K., Jenkins, T., Sewell, J., Via, D., & Crespo, A. (2004). Small signal measurement of Sc2O3 AlGaN/GaN moshemts. Solid-State Electronics, 48(2), 355-358. https://doi.org/10.1016/S0038-1101(03)00322-8