Small signal measurement of Sc2O3 AlGaN/GaN moshemts

B. Luo, R. Mehandru, B. S. Kang, Ji Hyun Kim, F. Ren, B. P. Gila, A. H. Onstine, C. R. Abernathy, S. J. Pearton, D. Gotthold, R. Birkhahn, B. Peres, R. Fitch, J. K. Gillespie, T. Jenkins, J. Sewell, D. Via, A. Crespo

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The rf performance of 1 × 200 μm2 AlGaN/GaN MOS-HEMTs with Sc2O3 used as both the gate dielectric and as a surface passivation layer is reported. A maximum fT of ∼ 11 GHz and fMAX of 19 GHz were obtained. The equivalent device parameters were extracted by fitting this data to obtain the transconductance, drain resistance, drain-source resistance, transfer time and gate-drain and gate-source capacitance as a function of gate voltage. The transfer time is in the order 0.5-1 ps and decreases with increasing gate voltage.

Original languageEnglish
Pages (from-to)355-358
Number of pages4
JournalSolid-State Electronics
Volume48
Issue number2
DOIs
Publication statusPublished - 2004 Feb 1
Externally publishedYes

Fingerprint

signal measurement
Gate dielectrics
Transconductance
Electric potential
High electron mobility transistors
Passivation
Capacitance
electric potential
transconductance
high electron mobility transistors
passivity
capacitance
aluminum gallium nitride
scandium oxide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Luo, B., Mehandru, R., Kang, B. S., Kim, J. H., Ren, F., Gila, B. P., ... Crespo, A. (2004). Small signal measurement of Sc2O3 AlGaN/GaN moshemts. Solid-State Electronics, 48(2), 355-358. https://doi.org/10.1016/S0038-1101(03)00322-8

Small signal measurement of Sc2O3 AlGaN/GaN moshemts. / Luo, B.; Mehandru, R.; Kang, B. S.; Kim, Ji Hyun; Ren, F.; Gila, B. P.; Onstine, A. H.; Abernathy, C. R.; Pearton, S. J.; Gotthold, D.; Birkhahn, R.; Peres, B.; Fitch, R.; Gillespie, J. K.; Jenkins, T.; Sewell, J.; Via, D.; Crespo, A.

In: Solid-State Electronics, Vol. 48, No. 2, 01.02.2004, p. 355-358.

Research output: Contribution to journalArticle

Luo, B, Mehandru, R, Kang, BS, Kim, JH, Ren, F, Gila, BP, Onstine, AH, Abernathy, CR, Pearton, SJ, Gotthold, D, Birkhahn, R, Peres, B, Fitch, R, Gillespie, JK, Jenkins, T, Sewell, J, Via, D & Crespo, A 2004, 'Small signal measurement of Sc2O3 AlGaN/GaN moshemts', Solid-State Electronics, vol. 48, no. 2, pp. 355-358. https://doi.org/10.1016/S0038-1101(03)00322-8
Luo, B. ; Mehandru, R. ; Kang, B. S. ; Kim, Ji Hyun ; Ren, F. ; Gila, B. P. ; Onstine, A. H. ; Abernathy, C. R. ; Pearton, S. J. ; Gotthold, D. ; Birkhahn, R. ; Peres, B. ; Fitch, R. ; Gillespie, J. K. ; Jenkins, T. ; Sewell, J. ; Via, D. ; Crespo, A. / Small signal measurement of Sc2O3 AlGaN/GaN moshemts. In: Solid-State Electronics. 2004 ; Vol. 48, No. 2. pp. 355-358.
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