Soft magnetic properties of sub 10 nm NiFe and Co films encapsulated with Ta or Cu

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Abstract

Magnetic properties of NiFe and Co thin films with thicknesses ranging from 2.5 to 10 nm have been studied. These films were encapsulated with 5 nm thick Ta or Cu films that have been commonly used for underlayer and capping purposes in magnetic sensors. NiFe samples were anisotropic and exhibited magnetic softness (low coercivity and low magnetostriction). The Cu/Co/Cu samples possessed low saturation magnetostriction of about-2 x 10-5 for the entire thickness range examined.

Original languageEnglish
Pages (from-to)1859-1861
Number of pages3
JournalPhysica Status Solidi (A) Applied Research
Volume201
Issue number8
DOIs
Publication statusPublished - 2004 Jun 1

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ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

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