Soft magnetic properties of sub 10 nm NiFe and Co films encapsulated with Ta or Cu

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Magnetic properties of NiFe and Co thin films with thicknesses ranging from 2.5 to 10 nm have been studied. These films were encapsulated with 5 nm thick Ta or Cu films that have been commonly used for underlayer and capping purposes in magnetic sensors. NiFe samples were anisotropic and exhibited magnetic softness (low coercivity and low magnetostriction). The Cu/Co/Cu samples possessed low saturation magnetostriction of about-2 x 10-5 for the entire thickness range examined.

Original languageEnglish
Pages (from-to)1859-1861
Number of pages3
JournalPhysica Status Solidi (A) Applied Research
Volume201
Issue number8
DOIs
Publication statusPublished - 2004 Jun 1

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Magnetostriction
magnetostriction
Magnetic properties
magnetic properties
Magnetic sensors
softness
Coercive force
coercivity
saturation
Thin films
sensors
thin films

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Soft magnetic properties of sub 10 nm NiFe and Co films encapsulated with Ta or Cu. / Kim, Young-geun.

In: Physica Status Solidi (A) Applied Research, Vol. 201, No. 8, 01.06.2004, p. 1859-1861.

Research output: Contribution to journalArticle

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