Soft-type trap-induced degradation of MoS₂ field effect transistors

Chemical Compounds

• Drain Current 100%
• Field Effect 64%
• Compound Mobility 33%
• Trap Density Measurement 32%
• Multilayer 19%
• Dielectric Material 19%
• Semiconductor 16%
• Oxide 11%
• Reduction 9%
• Time 7%

Engineering & Materials Science

• Drain current 82%
• Field effect transistors 69%
• Degradation 45%
• Power spectrum 23%
• Multilayers 20%
• Semiconductor materials 19%
• Oxides 18%
• Transistors 18%

Medicine & Life Sciences

• Semiconductors 92%
• Oxides 78%
• Noise 59%
• Equipment and Supplies 39%