Soft-type trap-induced degradation of MoS2 field effect transistors

Young Hoon Cho, Min Yeul Ryu, Kook Jin Lee, So Jeong Park, Jun Hee Choi, Byung Chul Lee, Wungyeon Kim, Gyu-Tae Kim

Research output: Contribution to journalArticle

1 Citation (Scopus)

Fingerprint Dive into the research topics of 'Soft-type trap-induced degradation of MoS<sub>2</sub> field effect transistors'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Medicine & Life Sciences