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Soft-type trap-induced degradation of MoS2 field effect transistors
Young Hoon Cho, Min Yeul Ryu, Kook Jin Lee, So Jeong Park, Jun Hee Choi, Byung Chul Lee, Wungyeon Kim, Gyu-Tae Kim
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)