Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Ki Hyuk Kim, H. I. Park, Jung ho Park, Sung Woo Hwang, J. Kang

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

Original languageEnglish
Pages (from-to)279-283
Number of pages5
JournalIEEE Transactions on Components and Packaging Technologies
Volume24
Issue number2
DOIs
Publication statusPublished - 2001 Jan 1

Fingerprint

Display devices
Plasmas
Parameter extraction
SPICE
Metals

Keywords

  • Impedance matching
  • Plasma display panel
  • RF
  • Software analysis
  • SPICE

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching. / Kim, Ki Hyuk; Park, H. I.; Park, Jung ho; Hwang, Sung Woo; Kang, J.

In: IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 2, 01.01.2001, p. 279-283.

Research output: Contribution to journalArticle

@article{e477636840c94e5fa05bf938373bcf1a,
title = "Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching",
abstract = "A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.",
keywords = "Impedance matching, Plasma display panel, RF, Software analysis, SPICE",
author = "Kim, {Ki Hyuk} and Park, {H. I.} and Park, {Jung ho} and Hwang, {Sung Woo} and J. Kang",
year = "2001",
month = "1",
day = "1",
doi = "10.1109/6144.926394",
language = "English",
volume = "24",
pages = "279--283",
journal = "IEEE Transactions on Components and Packaging Technologies",
issn = "1521-3331",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",

}

TY - JOUR

T1 - Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

AU - Kim, Ki Hyuk

AU - Park, H. I.

AU - Park, Jung ho

AU - Hwang, Sung Woo

AU - Kang, J.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

AB - A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

KW - Impedance matching

KW - Plasma display panel

KW - RF

KW - Software analysis

KW - SPICE

UR - http://www.scopus.com/inward/record.url?scp=0035364738&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035364738&partnerID=8YFLogxK

U2 - 10.1109/6144.926394

DO - 10.1109/6144.926394

M3 - Article

AN - SCOPUS:0035364738

VL - 24

SP - 279

EP - 283

JO - IEEE Transactions on Components and Packaging Technologies

JF - IEEE Transactions on Components and Packaging Technologies

SN - 1521-3331

IS - 2

ER -