Software-based analysis of radio frequency plasma display panel for efficient design and impedance matching

Ki Hyuk Kim, H. I. Park, J. H. Park, Sung Woo Hwang, J. Kang

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A full software analysis technique for the radio frequency (RF) plasma display panel (PDP) has been developed. The RF PDT test panel has been analyzed by the segmentation/three-dimensional (3-D) parameter extraction/SPICE simulation scheme, which was originally developed for the analysis of RF complimentary metal oxide semiconductor (CMOS) chips. Our technique is shown to be accurate in predicting the input impedance of the RF port and the calculated input impedance is used to perform impedance matching of the system. The technique is also extendable to a much larger size RF-PDP and has the possibility of being applied to the design and analysis of various interesting RF system and components.

Original languageEnglish
Pages (from-to)279-283
Number of pages5
JournalIEEE Transactions on Components and Packaging Technologies
Volume24
Issue number2
DOIs
Publication statusPublished - 2001 Jun

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Keywords

  • Impedance matching
  • Plasma display panel
  • RF
  • SPICE
  • Software analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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