Spectroscopic charge pumping investigation of the amphoteric nature of Si/ SiO2 interface states

J. T. Ryan, L. C. Yu, J. H. Han, J. J. Kopanski, K. P. Cheung, F. Zhang, C. Wang, J. P. Campbell, J. S. Suehle

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Spectroscopic charge pumping investigation of the amphoteric nature of Si/ SiO2 interface states'. Together they form a unique fingerprint.

Physics & Astronomy