TY - GEN
T1 - Spin Orbit Torque-RAM Write Energy Reduction with Self-Verification Scheme
AU - Kim, Taehwan
AU - Park, Jongsun
N1 - Publisher Copyright:
© 2018 IEEE.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2019/2/22
Y1 - 2019/2/22
N2 - As a promising candidate for replacing CMOS-based memories, non-volatile magnetic memory has been on a rise. While Spin transfer torque random access memory (STT-RAM) is considered as most promising candidate, it still suffers from various shortcomings concerning write operation. As a result, spin orbit torque random access memory (SOT-RAM) is considered as next generation non-volatile magnetic memory, for it offers relatively better performance and lower power. Even though SOT-RAM shows various advantages over STT-RAM, to meet the power level of CMOS-based memories, significant reduction of write power is highly required. Therefore, in this paper, we propose novel technique for reducing write power of SOT-RAM with redundant write prevention and early write termination. For application of two techniques, self-verification scheme is exploited. Simulation results using 65nm CMOS technology show that up to 69.5% of write energy can be saved compared to the conventional write operation.
AB - As a promising candidate for replacing CMOS-based memories, non-volatile magnetic memory has been on a rise. While Spin transfer torque random access memory (STT-RAM) is considered as most promising candidate, it still suffers from various shortcomings concerning write operation. As a result, spin orbit torque random access memory (SOT-RAM) is considered as next generation non-volatile magnetic memory, for it offers relatively better performance and lower power. Even though SOT-RAM shows various advantages over STT-RAM, to meet the power level of CMOS-based memories, significant reduction of write power is highly required. Therefore, in this paper, we propose novel technique for reducing write power of SOT-RAM with redundant write prevention and early write termination. For application of two techniques, self-verification scheme is exploited. Simulation results using 65nm CMOS technology show that up to 69.5% of write energy can be saved compared to the conventional write operation.
KW - Spin-orbit torque(SOT)
KW - Write power reduction
UR - http://www.scopus.com/inward/record.url?scp=85063188099&partnerID=8YFLogxK
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U2 - 10.1109/ISOCC.2018.8649942
DO - 10.1109/ISOCC.2018.8649942
M3 - Conference contribution
AN - SCOPUS:85063188099
T3 - Proceedings - International SoC Design Conference 2018, ISOCC 2018
SP - 19
EP - 20
BT - Proceedings - International SoC Design Conference 2018, ISOCC 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th International SoC Design Conference, ISOCC 2018
Y2 - 12 November 2018 through 15 November 2018
ER -