Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures

Seok Jin Yun; Sang Ho Lim; Seong Rae Lee

doi:10.1063/1.4942206

Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures

Seok Jin Yun, Sang Ho Lim, Seong Rae Lee

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

Strong interlayer exchange coupling (IEC) and high post-annealing stability are demonstrated for perpendicular synthetic ferrimagnets (p-SyFs) with [Pt/Co]₆/Ru/[Co/Pt]₃ structures. The observed IEC strength was 2.55 ergs/cm² for a Ru thickness of 0.35 nm, representing the highest value achieved up to date for similar structures. The IEC remained strong even after annealing at 450^oC, for the practically important Ru layer thickness of 0.85 nm. The biquadratic IEC, a parameter quantifying the pinhole effects in SyFs, was confirmed by analyzing the experimental results by using the total energy functional, and its strength increased with decreasing the temperature and Ru layer thickness.

Original language	English
Article number	025112
Journal	AIP Advances
Volume	6
Issue number	2
DOIs	https://doi.org/10.1063/1.4942206
Publication status	Published - 2016 Feb 1

ASJC Scopus subject areas

Physics and Astronomy(all)

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@article{a003e988bcda4ad6aa9ab3d2f8c2b80b,

title = "Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures",

abstract = "Strong interlayer exchange coupling (IEC) and high post-annealing stability are demonstrated for perpendicular synthetic ferrimagnets (p-SyFs) with [Pt/Co]6/Ru/[Co/Pt]3 structures. The observed IEC strength was 2.55 ergs/cm2 for a Ru thickness of 0.35 nm, representing the highest value achieved up to date for similar structures. The IEC remained strong even after annealing at 450oC, for the practically important Ru layer thickness of 0.85 nm. The biquadratic IEC, a parameter quantifying the pinhole effects in SyFs, was confirmed by analyzing the experimental results by using the total energy functional, and its strength increased with decreasing the temperature and Ru layer thickness.",

author = "Yun, {Seok Jin} and Lim, {Sang Ho} and Lee, {Seong Rae}",

note = "Funding Information: This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIP) (2011-0028163). Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = feb,

day = "1",

doi = "10.1063/1.4942206",

language = "English",

volume = "6",

journal = "AIP Advances",

issn = "2158-3226",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures

AU - Yun, Seok Jin

AU - Lim, Sang Ho

AU - Lee, Seong Rae

PY - 2016/2/1

Y1 - 2016/2/1

N2 - Strong interlayer exchange coupling (IEC) and high post-annealing stability are demonstrated for perpendicular synthetic ferrimagnets (p-SyFs) with [Pt/Co]6/Ru/[Co/Pt]3 structures. The observed IEC strength was 2.55 ergs/cm2 for a Ru thickness of 0.35 nm, representing the highest value achieved up to date for similar structures. The IEC remained strong even after annealing at 450oC, for the practically important Ru layer thickness of 0.85 nm. The biquadratic IEC, a parameter quantifying the pinhole effects in SyFs, was confirmed by analyzing the experimental results by using the total energy functional, and its strength increased with decreasing the temperature and Ru layer thickness.

AB - Strong interlayer exchange coupling (IEC) and high post-annealing stability are demonstrated for perpendicular synthetic ferrimagnets (p-SyFs) with [Pt/Co]6/Ru/[Co/Pt]3 structures. The observed IEC strength was 2.55 ergs/cm2 for a Ru thickness of 0.35 nm, representing the highest value achieved up to date for similar structures. The IEC remained strong even after annealing at 450oC, for the practically important Ru layer thickness of 0.85 nm. The biquadratic IEC, a parameter quantifying the pinhole effects in SyFs, was confirmed by analyzing the experimental results by using the total energy functional, and its strength increased with decreasing the temperature and Ru layer thickness.

UR - http://www.scopus.com/inward/record.url?scp=84958581233&partnerID=8YFLogxK

U2 - 10.1063/1.4942206

DO - 10.1063/1.4942206

M3 - Article

AN - SCOPUS:84958581233

SN - 2158-3226

VL - 6

JO - AIP Advances

JF - AIP Advances

IS - 2

M1 - 025112

ER -

Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures

Abstract

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