Structural and electrical properties of (Zr,Ti)0.85(Ca,Sr)0.15O1.85 thin films grown on Cu/Ti/SiO2/Si substrate using RF magnetron sputtering

Mir Im, Tae Ho Lee, Sang Hyo Kweon, Chong Yun Kang, Sahn Nahm

Research output: Contribution to journal › Article › peer-review

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Engineering & Materials Science

Chemical Compounds