Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method

Ji Hoon Kim, Jung ho Park, Kwang Hyeon Baik, Sung Min Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated the structural and optical characteristics of nonpolar a-plane (11-20) GaN structure grown on TiO2 nanoparticles (NP)-coated r-plane sapphire by spin coating method. The surface morphology without any observable inverse pyramidal pits was observed by atomic force microscopy (AFM) measurement. Transmission electron microscopy (TEM) analysis revealed that the threading dislocations (TDs) and basal plane stacking faults (BSFs) densities were around 4.5 × 109 cm-2 and 3.1 × 10 5 cm-1, respectively. It was also found that the broadening of x-ray rocking curves (XRC) full width at a half maximum (FWHM) in Si-doped a-plane GaN on the TiO2 NP-coated r-plane sapphire was affected by the tilt and twist of mosaic crystals. The photoluminescence (PL) intensity of TiO2 NP-related MQWs sample at 295 K was approximately 18 % higher than that of the reference sample. This implied that the improved PL intensity was attributed to scattering of light by TiO2 NP and InGaN/GaN MQWs interface of high quality.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume8123
DOIs
Publication statusPublished - 2011 Oct 17
Event11th International Conference on Solid State Lighting - San Diego, CA, United States
Duration: 2011 Aug 222011 Aug 24

Other

Other11th International Conference on Solid State Lighting
CountryUnited States
CitySan Diego, CA
Period11/8/2211/8/24

Fingerprint

Titanium Oxide
Aluminum Oxide
Sapphire
Titanium oxides
Spin coating
titanium oxides
Structural Properties
Optical Properties
TiO2
Coating
Nanoparticles
coating
Structural properties
sapphire
Optical properties
optical properties
nanoparticles
Photoluminescence
photoluminescence
Stacking faults

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Kim, J. H., Park, J. H., Baik, K. H., & Hwang, S. M. (2011). Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 8123). [812314] https://doi.org/10.1117/12.893321

Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method. / Kim, Ji Hoon; Park, Jung ho; Baik, Kwang Hyeon; Hwang, Sung Min.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8123 2011. 812314.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, JH, Park, JH, Baik, KH & Hwang, SM 2011, Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 8123, 812314, 11th International Conference on Solid State Lighting, San Diego, CA, United States, 11/8/22. https://doi.org/10.1117/12.893321
Kim JH, Park JH, Baik KH, Hwang SM. Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8123. 2011. 812314 https://doi.org/10.1117/12.893321
Kim, Ji Hoon ; Park, Jung ho ; Baik, Kwang Hyeon ; Hwang, Sung Min. / Structural and optical properties of a-plane GaN on r-plane sapphire with titanium oxide nanoparticles coated by spin coating method. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8123 2011.
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AB - We investigated the structural and optical characteristics of nonpolar a-plane (11-20) GaN structure grown on TiO2 nanoparticles (NP)-coated r-plane sapphire by spin coating method. The surface morphology without any observable inverse pyramidal pits was observed by atomic force microscopy (AFM) measurement. Transmission electron microscopy (TEM) analysis revealed that the threading dislocations (TDs) and basal plane stacking faults (BSFs) densities were around 4.5 × 109 cm-2 and 3.1 × 10 5 cm-1, respectively. It was also found that the broadening of x-ray rocking curves (XRC) full width at a half maximum (FWHM) in Si-doped a-plane GaN on the TiO2 NP-coated r-plane sapphire was affected by the tilt and twist of mosaic crystals. The photoluminescence (PL) intensity of TiO2 NP-related MQWs sample at 295 K was approximately 18 % higher than that of the reference sample. This implied that the improved PL intensity was attributed to scattering of light by TiO2 NP and InGaN/GaN MQWs interface of high quality.

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