Structural study of epitaxial MN/AG multilayers

S. Nahm, L. Salamanca-Riba, B. T. Jonker

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


We have studied the epitaxial growth and structural properties of single crystal Mn/ Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fee precursor structure of Mn is proposed with a lattice parameter of 3.94Â and is expected to be antiferromagnetic.

Original languageEnglish
Pages (from-to)719-722
Number of pages4
JournalJournal of Electronic Materials
Issue number7
Publication statusPublished - 1991 Jul
Externally publishedYes


  • Multilayers
  • TEM
  • magnetic properties

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry


Dive into the research topics of 'Structural study of epitaxial MN/AG multilayers'. Together they form a unique fingerprint.

Cite this