Structural study of epitaxial MN/AG multilayers

Sahn Nahm, L. Salamanca-Riba, B. T. Jonker

Research output: Contribution to journalArticle

Abstract

We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.

Original languageEnglish
Pages (from-to)719-722
Number of pages4
JournalJournal of Electronic Materials
Volume20
Issue number10
Publication statusPublished - 1991 Oct 1
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Nahm, S., Salamanca-Riba, L., & Jonker, B. T. (1991). Structural study of epitaxial MN/AG multilayers. Journal of Electronic Materials, 20(10), 719-722.