Structural study of epitaxial MN/AG multilayers

Sahn Nahm, L. Salamanca-Riba, B. T. Jonker

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.

Original languageEnglish
Pages (from-to)719-722
Number of pages4
JournalJournal of Electronic Materials
Volume20
Issue number10
Publication statusPublished - 1991 Oct 1
Externally publishedYes

Fingerprint

Multilayers
Monolayers
Substrates
Buffer layers
Epitaxial growth
Lattice constants
Seed
Structural properties
seeds
lattice parameters
buffers
Single crystals
Transmission electron microscopy
transmission electron microscopy
single crystals
gallium arsenide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)

Cite this

Nahm, S., Salamanca-Riba, L., & Jonker, B. T. (1991). Structural study of epitaxial MN/AG multilayers. Journal of Electronic Materials, 20(10), 719-722.

Structural study of epitaxial MN/AG multilayers. / Nahm, Sahn; Salamanca-Riba, L.; Jonker, B. T.

In: Journal of Electronic Materials, Vol. 20, No. 10, 01.10.1991, p. 719-722.

Research output: Contribution to journalArticle

Nahm, S, Salamanca-Riba, L & Jonker, BT 1991, 'Structural study of epitaxial MN/AG multilayers', Journal of Electronic Materials, vol. 20, no. 10, pp. 719-722.
Nahm S, Salamanca-Riba L, Jonker BT. Structural study of epitaxial MN/AG multilayers. Journal of Electronic Materials. 1991 Oct 1;20(10):719-722.
Nahm, Sahn ; Salamanca-Riba, L. ; Jonker, B. T. / Structural study of epitaxial MN/AG multilayers. In: Journal of Electronic Materials. 1991 ; Vol. 20, No. 10. pp. 719-722.
@article{0c052cc6b58143cea911315a55f120d0,
title = "Structural study of epitaxial MN/AG multilayers",
abstract = "We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.",
author = "Sahn Nahm and L. Salamanca-Riba and Jonker, {B. T.}",
year = "1991",
month = "10",
day = "1",
language = "English",
volume = "20",
pages = "719--722",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
publisher = "Springer New York",
number = "10",

}

TY - JOUR

T1 - Structural study of epitaxial MN/AG multilayers

AU - Nahm, Sahn

AU - Salamanca-Riba, L.

AU - Jonker, B. T.

PY - 1991/10/1

Y1 - 1991/10/1

N2 - We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.

AB - We have studied the epitaxial growth and structural properties of single crystal Mn/Ag multilayers grown on (001) GaAs substrates using transmission electron microscopy. A buffer layer of Ag (001) was grown on a 5 monolayer Fe seed layer on the (001) GaAs substrate before the growth of the multilayers to obtain good quality films. Mn/Ag multilayers show very sharp and coherent interfaces for Mn layer thicknesses up to ≈ 14 monolayers. The structure of Mn in Mn/Ag multilayers depends on the thickness of the Mn layer. An fcc precursor structure of Mn is proposed with a lattice parameter of 3.94A and is expected to be antiferromagnetic.

UR - http://www.scopus.com/inward/record.url?scp=0026237796&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026237796&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0026237796

VL - 20

SP - 719

EP - 722

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

SN - 0361-5235

IS - 10

ER -