Structure and morphology of vacuum-evaporated pentacene as a function of the substrate temperature

Jae Won Chang, Hoon Kim, Jai Kyeong Kim, Byeong Kwon Ju, Jin Jang, Yun Hi Lee

Research output: Contribution to journalConference articlepeer-review

17 Citations (Scopus)

Abstract

In order to reach high quality of organic thin films such as high mobility for device applications, it is strongly desirable to study the growth properties of pentacene film as a function of evaporation conditions. Here, we report the structure and morphology of thermal evaporated pentacene thin film by Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and X-ray diffractometry (XRD) as a function of the evaporation rate and substrate temperature. These results play a key role in determining the electrical performance of organic thin film transistor devices.

Original languageEnglish
Pages (from-to)S647-S651
JournalJournal of the Korean Physical Society
Volume42
Issue numberSPEC.
Publication statusPublished - 2003 Feb
EventProceedings of The 11th Seoul International Symposium on the Physics of Semiconductors and Apllications - 2002 - Cheju Island, Korea, Republic of
Duration: 2002 Aug 202002 Aug 23

Keywords

  • Re-evaporation
  • Vacuum-evaporated pentacene

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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