In order to reach high quality of organic thin films such as high mobility for device applications, it is strongly desirable to study the growth properties of pentacene film as a function of evaporation conditions. Here, we report the structure and morphology of thermal evaporated pentacene thin film by Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and X-ray diffractometry (XRD) as a function of the evaporation rate and substrate temperature. These results play a key role in determining the electrical performance of organic thin film transistor devices.
|Journal||Journal of the Korean Physical Society|
|Publication status||Published - 2003 Feb 1|
- Vacuum-evaporated pentacene
ASJC Scopus subject areas
- Physics and Astronomy(all)