Studies of tetracene- and pentacene-based organic thin-film transistors fabricated by the neutral cluster beam deposition method

Engineering & Materials Science

• Atomic force microscopy 19%
• Carrier mobility 23%
• Crystalline materials 16%
• Crystallinity 19%
• Current voltage characteristics 20%
• Drain current 19%
• Electric potential 8%
• Modulation 12%
• Molecules 15%
• Silica 16%
• Structural properties 16%
• Substrates 11%
• Surface morphology 35%
• Surface structure 18%
• Surface treatment 32%
• Temperature 12%
• Thin film transistors 100%
• Thin films 73%
• Threshold voltage 17%
• X ray diffraction 15%

Chemical Compounds

• Ambient Reaction Temperature 9%
• Atomic Force Microscopy 6%
• Compound Mobility 13%
• Crystallinity 6%
• Field Effect 8%
• Hexamethyldisilazane 35%
• Molecular Cluster 51%
• Molecule 3%
• Pentacene 45%
• Silicon Dioxide 10%
• Surface 13%
• Tetracene 37%
• Voltage 12%
• X-Ray Diffraction 4%

Physics & Astronomy

• atomic force microscopy 6%
• carrier mobility 8%
• crystallinity 7%
• diffraction 4%
• electric contacts 7%
• electric potential 9%
• hole mobility 9%
• modulation 5%
• molecules 4%
• performance 3%
• room temperature 9%
• silicon dioxide 6%
• slopes 6%
• surface treatment 18%
• thin films 40%
• threshold voltage 8%
• transistors 62%
• x rays 3%