Study of structural defects in CdZnTe crystals by high resolution electron microscopy

A. Hossain, A. E. Bolotnikov, G. S. Camarda, Y. Cui, R. Gul, Kihyun Kim, K. Kisslinger, D. Su, G. Yang, L. H. Zhang, R. B. James

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.

Original languageEnglish
Title of host publicationNuclear Radiation Detection Materials - 2011
Pages67-71
Number of pages5
DOIs
Publication statusPublished - 2012 Feb 20
Externally publishedYes
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: 2011 Apr 252011 Apr 29

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1341
ISSN (Print)0272-9172

Conference

Conference2011 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period11/4/2511/4/29

Fingerprint

High resolution electron microscopy
electron microscopy
Defects
Crystals
high resolution
defects
crystals
optical microscopes
Dislocations (crystals)
Precipitates
precipitates
Electric properties
Microscopes
Electron microscopes
electron microscopes
electrical properties
microscopes
Transmission electron microscopy
Infrared radiation
Scanning

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Hossain, A., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Gul, R., Kim, K., ... James, R. B. (2012). Study of structural defects in CdZnTe crystals by high resolution electron microscopy. In Nuclear Radiation Detection Materials - 2011 (pp. 67-71). (Materials Research Society Symposium Proceedings; Vol. 1341). https://doi.org/10.1557/opl.2011.1206

Study of structural defects in CdZnTe crystals by high resolution electron microscopy. / Hossain, A.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Gul, R.; Kim, Kihyun; Kisslinger, K.; Su, D.; Yang, G.; Zhang, L. H.; James, R. B.

Nuclear Radiation Detection Materials - 2011. 2012. p. 67-71 (Materials Research Society Symposium Proceedings; Vol. 1341).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hossain, A, Bolotnikov, AE, Camarda, GS, Cui, Y, Gul, R, Kim, K, Kisslinger, K, Su, D, Yang, G, Zhang, LH & James, RB 2012, Study of structural defects in CdZnTe crystals by high resolution electron microscopy. in Nuclear Radiation Detection Materials - 2011. Materials Research Society Symposium Proceedings, vol. 1341, pp. 67-71, 2011 MRS Spring Meeting, San Francisco, CA, United States, 11/4/25. https://doi.org/10.1557/opl.2011.1206
Hossain A, Bolotnikov AE, Camarda GS, Cui Y, Gul R, Kim K et al. Study of structural defects in CdZnTe crystals by high resolution electron microscopy. In Nuclear Radiation Detection Materials - 2011. 2012. p. 67-71. (Materials Research Society Symposium Proceedings). https://doi.org/10.1557/opl.2011.1206
Hossain, A. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Gul, R. ; Kim, Kihyun ; Kisslinger, K. ; Su, D. ; Yang, G. ; Zhang, L. H. ; James, R. B. / Study of structural defects in CdZnTe crystals by high resolution electron microscopy. Nuclear Radiation Detection Materials - 2011. 2012. pp. 67-71 (Materials Research Society Symposium Proceedings).
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