Abstract
We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.
| Original language | English |
|---|---|
| Title of host publication | Nuclear Radiation Detection Materials - 2011 |
| Pages | 67-71 |
| Number of pages | 5 |
| DOIs | |
| Publication status | Published - 2012 Feb 20 |
| Externally published | Yes |
| Event | 2011 MRS Spring Meeting - San Francisco, CA, United States Duration: 2011 Apr 25 → 2011 Apr 29 |
Publication series
| Name | Materials Research Society Symposium Proceedings |
|---|---|
| Volume | 1341 |
| ISSN (Print) | 0272-9172 |
Conference
| Conference | 2011 MRS Spring Meeting |
|---|---|
| Country | United States |
| City | San Francisco, CA |
| Period | 11/4/25 → 11/4/29 |
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ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
Cite this
Study of structural defects in CdZnTe crystals by high resolution electron microscopy. / Hossain, A.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Gul, R.; Kim, Kihyun; Kisslinger, K.; Su, D.; Yang, G.; Zhang, L. H.; James, R. B.
Nuclear Radiation Detection Materials - 2011. 2012. p. 67-71 (Materials Research Society Symposium Proceedings; Vol. 1341).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Study of structural defects in CdZnTe crystals by high resolution electron microscopy
AU - Hossain, A.
AU - Bolotnikov, A. E.
AU - Camarda, G. S.
AU - Cui, Y.
AU - Gul, R.
AU - Kim, Kihyun
AU - Kisslinger, K.
AU - Su, D.
AU - Yang, G.
AU - Zhang, L. H.
AU - James, R. B.
PY - 2012/2/20
Y1 - 2012/2/20
N2 - We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.
AB - We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.
UR - http://www.scopus.com/inward/record.url?scp=84863166537&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84863166537&partnerID=8YFLogxK
U2 - 10.1557/opl.2011.1206
DO - 10.1557/opl.2011.1206
M3 - Conference contribution
AN - SCOPUS:84863166537
SN - 9781605113180
T3 - Materials Research Society Symposium Proceedings
SP - 67
EP - 71
BT - Nuclear Radiation Detection Materials - 2011
ER -