TY - GEN
T1 - Study of structural defects in CdZnTe crystals by high resolution electron microscopy
AU - Hossain, A.
AU - Bolotnikov, A. E.
AU - Camarda, G. S.
AU - Cui, Y.
AU - Gul, R.
AU - Kim, K. H.
AU - Kisslinger, K.
AU - Su, D.
AU - Yang, G.
AU - Zhang, L. H.
AU - James, R. B.
N1 - Funding Information:
This work was supported by U.S. Department of Energy, Office of Nonproliferation Research and Development, NA-22. The manuscript has been authored by Brookhaven Science Associates, LLC under Contract No. DE-AC02-98CH1-886 with the U.S. Department of Energy. The United States Government retains, and the publisher, by accepting the article for publication, acknowledges, a world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for the United States Government purposes.
PY - 2012
Y1 - 2012
N2 - We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.
AB - We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.
UR - http://www.scopus.com/inward/record.url?scp=84863166537&partnerID=8YFLogxK
U2 - 10.1557/opl.2011.1206
DO - 10.1557/opl.2011.1206
M3 - Conference contribution
AN - SCOPUS:84863166537
SN - 9781605113180
T3 - Materials Research Society Symposium Proceedings
SP - 67
EP - 71
BT - Nuclear Radiation Detection Materials - 2011
T2 - 2011 MRS Spring Meeting
Y2 - 25 April 2011 through 29 April 2011
ER -