18F Half-life measurement using 2-γ coincidence method

Y. S. Kang, J. K. Ahn, S. H. Kim, J. I. Byun, J. B. Han, K. B. Lee

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting 18F (τ1/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity 18F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of 18F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a 22Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of 18F is estimated as 109.73±0.14min.

Original languageEnglish
Pages (from-to)7-10
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Publication statusPublished - 2015 Nov 21


  • Coincidence measurement
  • Dead time correction
  • F
  • HPGe detector

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation


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