18F Half-life measurement using 2-γ coincidence method

Y. S. Kang; J. K. Ahn; S. H. Kim; J. I. Byun; J. B. Han; K. B. Lee

doi:10.1016/j.nima.2015.08.025

¹⁸F Half-life measurement using 2-γ coincidence method

Y. S. Kang, J. K. Ahn, S. H. Kim, J. I. Byun, J. B. Han, K. B. Lee

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting ¹⁸F (τ1_/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity ¹⁸F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of ¹⁸F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a ²²Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of ¹⁸F is estimated as 109.73±0.14min.

Original language	English
Pages (from-to)	7-10
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	801
DOIs	https://doi.org/10.1016/j.nima.2015.08.025
Publication status	Published - 2015 Nov 21

Keywords

Coincidence measurement
Dead time correction
F
HPGe detector

ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

Access to Document

10.1016/j.nima.2015.08.025

Cite this

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title = "18F Half-life measurement using 2-γ coincidence method",

abstract = "The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting 18F (τ1/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity 18F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of 18F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a 22Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of 18F is estimated as 109.73±0.14min.",

keywords = "Coincidence measurement, Dead time correction, F, HPGe detector",

author = "Kang, {Y. S.} and Ahn, {J. K.} and Kim, {S. H.} and Byun, {J. I.} and Han, {J. B.} and Lee, {K. B.}",

year = "2015",

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doi = "10.1016/j.nima.2015.08.025",

language = "English",

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T1 - 18F Half-life measurement using 2-γ coincidence method

AU - Kang, Y. S.

AU - Ahn, J. K.

AU - Kim, S. H.

AU - Byun, J. I.

AU - Han, J. B.

AU - Lee, K. B.

PY - 2015/11/21

Y1 - 2015/11/21

N2 - The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting 18F (τ1/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity 18F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of 18F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a 22Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of 18F is estimated as 109.73±0.14min.

AB - The accuracy of the half-life measurement of short-lived radioisotopes such as positron-emitting 18F (τ1/2 ≈ 100min) is limited mainly by inaccuracies in the detector counting statistics. Gamma-ray measurement with a high-activity 18F source requires counting-loss corrections to compensate for random summing effects and the detector's dead time. In this study, we measure the half-life of 18F with two 511-keV γ-rays using two high-purity germanium (HPGe) detectors. The counting-loss corrections are performed via two approaches to address the problems of random coincidence summing and dead time: a half-life measurement with a 22Na source and a Geant4 simulation of the detector response. Variations in the full-width at half maximum (FWHM) of the 511-keV peak are found to show good correlation with the random summing effect. The half-life of 18F is estimated as 109.73±0.14min.

KW - Coincidence measurement

KW - Dead time correction

KW - F

KW - HPGe detector

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