18F half-life measurement using a high-purity germanium detector

Jubong Han, K. B. Lee, T. S. Park, J. M. Lee, P. J. Oh, S. H. Lee, Y. S. Kang, J. K. Ahn

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The half-life of 18F has been measured using HPGe detectors with a 137Cs reference source. The counting ratio of 511keV γ-rays from 18F to 622keV γ-rays from 137Cs was fitted for the half-life with a weighted least-square method. Uncertainties due to the systematic effects arising from the measurement of a high activity 18F source were studied in detail. The half-life of 18F was found to be (109.72±0.19)min. The result is in a good agreement with the recommended value of (109.728±0.019)min evaluated at the Laborotaire National Henri Becquerel (LNHB).

Original languageEnglish
Pages (from-to)2581-2585
Number of pages5
JournalApplied Radiation and Isotopes
Volume70
Issue number11
DOIs
Publication statusPublished - 2012 Nov

Keywords

  • F
  • HPGe detector
  • Half-life
  • Reference source method

ASJC Scopus subject areas

  • Radiation

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    Han, J., Lee, K. B., Park, T. S., Lee, J. M., Oh, P. J., Lee, S. H., Kang, Y. S., & Ahn, J. K. (2012). 18F half-life measurement using a high-purity germanium detector. Applied Radiation and Isotopes, 70(11), 2581-2585. https://doi.org/10.1016/j.apradiso.2012.07.015