Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells

Doo Hyun Ko, John R. Tumbleston, Myoung Ryul Ok, Honggu Chun, Rene Lopez, Edward Samulski

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.

Original languageEnglish
Article number083101
JournalJournal of Applied Physics
Volume108
Issue number8
DOIs
Publication statusPublished - 2010 Oct 15
Externally publishedYes

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solar cells
retarding
heterojunction devices
electrical resistivity
electrons
short circuit currents
luminous intensity
photocurrents
heterojunctions
illumination
diodes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells. / Ko, Doo Hyun; Tumbleston, John R.; Ok, Myoung Ryul; Chun, Honggu; Lopez, Rene; Samulski, Edward.

In: Journal of Applied Physics, Vol. 108, No. 8, 083101, 15.10.2010.

Research output: Contribution to journalArticle

Ko, Doo Hyun ; Tumbleston, John R. ; Ok, Myoung Ryul ; Chun, Honggu ; Lopez, Rene ; Samulski, Edward. / Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells. In: Journal of Applied Physics. 2010 ; Vol. 108, No. 8.
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