Abstract
Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.
Original language | English |
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Article number | 083101 |
Journal | Journal of Applied Physics |
Volume | 108 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2010 Oct 15 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)