Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells

Doo Hyun Ko; John R. Tumbleston; Myoung Ryul Ok; Honggu Chun; Rene Lopez; Edward Samulski

doi:10.1063/1.3488609

Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells

Doo Hyun Ko, John R. Tumbleston, Myoung Ryul Ok, Honggu Chun, Rene Lopez, Edward Samulski

Research output: Contribution to journal › Article

7 Citations (Scopus)

Abstract

Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.

Original language	English
Article number	083101
Journal	Journal of Applied Physics
Volume	108
Issue number	8
DOIs	https://doi.org/10.1063/1.3488609
Publication status	Published - 2010 Oct 15
Externally published	Yes

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ASJC Scopus subject areas

Physics and Astronomy(all)

Cite this

Ko, D. H., Tumbleston, J. R., Ok, M. R., Chun, H., Lopez, R., & Samulski, E. (2010). Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells. Journal of Applied Physics, 108(8), [083101]. https://doi.org/10.1063/1.3488609

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AU - Samulski, Edward

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10.1063/1.3488609