Abstract
Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.
| Original language | English |
|---|---|
| Article number | 083101 |
| Journal | Journal of Applied Physics |
| Volume | 108 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2010 Oct 15 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
Cite this
Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells. / Ko, Doo Hyun; Tumbleston, John R.; Ok, Myoung Ryul; Chun, Honggu; Lopez, Rene; Samulski, Edward.
In: Journal of Applied Physics, Vol. 108, No. 8, 083101, 15.10.2010.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Suppression of bimolecular recombination by UV-sensitive electron transport layers in organic solar cells
AU - Ko, Doo Hyun
AU - Tumbleston, John R.
AU - Ok, Myoung Ryul
AU - Chun, Honggu
AU - Lopez, Rene
AU - Samulski, Edward
PY - 2010/10/15
Y1 - 2010/10/15
N2 - Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.
AB - Incorporating UV-sensitive electron transport layers (ETLs) into organic bulk heterojunction (BHJ) photovoltaic devices dramatically impacts short-circuit current (Jsc) and fill factor characteristics. Resistivity changes induced by UV illumination in the ETL of inverted BHJ devices suppress bimolecular recombination producing up to a two orders of magnitude change in Jsc. Electro-optical modeling and light intensity experiments effectively demonstrate that bimolecular recombination, in the form of diode current losses, controls the extracted photocurrent and is directly dependent on the ETL resistivity.
UR - http://www.scopus.com/inward/record.url?scp=78149446111&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78149446111&partnerID=8YFLogxK
U2 - 10.1063/1.3488609
DO - 10.1063/1.3488609
M3 - Article
AN - SCOPUS:78149446111
VL - 108
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 8
M1 - 083101
ER -