Suppression of edge effects based on analytic model for leakage current reduction of sub-40 nm DRAM device

Soo Han Choi, Young Hee Park, Chul Hong Park, Sang Hoon Lee, Moon Hyun Yoo, Jun Dong Cho, Gyu Tae Kim

Research output: Contribution to journalArticlepeer-review

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Chemical Compounds

Engineering & Materials Science