Surface properties of topological insulator Bi2Se3 nanoparticles separated by impedance spectroscopy

Dong Min Choi, Kyu Won Lee, Gi Wan Jeon, Do Wan Kim, Cheol Eui Lee

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We have separated the surface and bulk electrical properties of the Bi2Se3 nanoparticles by means of impedance spectroscopy. An equivalent circuit analysis of the complex impedance data comprising two separate resistance components, RB and RS, and two separate inductance components, LB and LS, enabled us to separate the bulk and surface properties of the topological insulator. One of the resistance components, RS, attributed to the surface, showed no temperature dependence, whereas the other, RB, attributed to the bulk, showed a weak metallic behavior. With increasing surface-to-bulk ratio by mixing with insulating Al2O3 nanoparticles up to the ratio of 1:1, the surface resistivity showed decrease up to ∼70%, whereas the bulk resistivity showed increase up to ∼150%. While the bulk state showed increasing electrical resistivity up to 200% with aging up to 30 days, the surface state resistivity did not show an aging effect.

Original languageEnglish
Article number253103
JournalApplied Physics Letters
Volume110
Issue number25
DOIs
Publication statusPublished - 2017 Jun 19

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surface properties
insulators
impedance
nanoparticles
electrical resistivity
spectroscopy
equivalent circuits
inductance
electrical properties
temperature dependence

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Surface properties of topological insulator Bi2Se3 nanoparticles separated by impedance spectroscopy. / Choi, Dong Min; Lee, Kyu Won; Jeon, Gi Wan; Kim, Do Wan; Lee, Cheol Eui.

In: Applied Physics Letters, Vol. 110, No. 25, 253103, 19.06.2017.

Research output: Contribution to journalArticle

Choi, Dong Min ; Lee, Kyu Won ; Jeon, Gi Wan ; Kim, Do Wan ; Lee, Cheol Eui. / Surface properties of topological insulator Bi2Se3 nanoparticles separated by impedance spectroscopy. In: Applied Physics Letters. 2017 ; Vol. 110, No. 25.
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