Symmetry detection by generalized complex (GC) moments: a close-form solution

Dinggang Shen, Horace H S Ip, Kent K T Cheung, Earn Khwang Teoh

Research output: Contribution to journalArticle

89 Citations (Scopus)

Abstract

This paper presents a unified method for detecting both reflection-symmetry and rotation-symmetry of 2D images based on an identical set of features, i.e., the first three nonzero generalized complex (GC) moments. This method is theoretically guaranteed to detect all the axes of symmetries of every 2D image, if more nonzero GC moments are used in the feature set. Furthermore, we establish the relationship between reflectional symmetry and rotational symmetry in an image, which can be used to check the correctness of symmetry detection. This method has been demonstrated experimentally using more than 200 images.

Original languageEnglish
Pages (from-to)466-476
Number of pages11
JournalIEEE Transactions on Pattern Analysis and Machine Intelligence
Volume21
Issue number5
DOIs
Publication statusPublished - 1999 Jan 1
Externally publishedYes

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Moment
Reflectional symmetry
Symmetry
Rotational symmetry
Correctness
Form
Relationships

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Artificial Intelligence
  • Computer Vision and Pattern Recognition

Cite this

Symmetry detection by generalized complex (GC) moments : a close-form solution. / Shen, Dinggang; Ip, Horace H S; Cheung, Kent K T; Teoh, Earn Khwang.

In: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 21, No. 5, 01.01.1999, p. 466-476.

Research output: Contribution to journalArticle

Shen, Dinggang ; Ip, Horace H S ; Cheung, Kent K T ; Teoh, Earn Khwang. / Symmetry detection by generalized complex (GC) moments : a close-form solution. In: IEEE Transactions on Pattern Analysis and Machine Intelligence. 1999 ; Vol. 21, No. 5. pp. 466-476.
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