Abstract
This paper presents a unified method for detecting both reflection-symmetry and rotation-symmetry of 2D images based on an identical set of features, i.e., the first three nonzero generalized complex (GC) moments. This method is theoretically guaranteed to detect all the axes of symmetries of every 2D image, if more nonzero GC moments are used in the feature set. Furthermore, we establish the relationship between reflectional symmetry and rotational symmetry in an image, which can be used to check the correctness of symmetry detection. This method has been demonstrated experimentally using more than 200 images.
| Original language | English |
|---|---|
| Pages (from-to) | 466-476 |
| Number of pages | 11 |
| Journal | IEEE Transactions on Pattern Analysis and Machine Intelligence |
| Volume | 21 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1999 Jan 1 |
| Externally published | Yes |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Artificial Intelligence
- Computer Vision and Pattern Recognition
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Cite this
Shen, D., Ip, H. H. S., Cheung, K. K. T., & Teoh, E. K. (1999). Symmetry detection by generalized complex (GC) moments: a close-form solution. IEEE Transactions on Pattern Analysis and Machine Intelligence, 21(5), 466-476. https://doi.org/10.1109/34.765657