System and method for customized one-stop physical examination

Choon Hak Lim (Inventor)

Research output: Patent

Abstract

원스톱 맞춤형 건강검진 시스템 및 그 검진 방법
Original languageEnglish
Patent number10-1611176
Publication statusPublished - 2016 Apr 5

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  • Cite this

    Lim, C. H. (2016). System and method for customized one-stop physical examination. (Patent No. 10-1611176).