TY - JOUR
T1 - System Informatics
T2 - From Methodology to Applications
AU - Zhao, Kang
AU - Xie, Yao
AU - Tsui, Kwok Leung
AU - Wei, Qingming
AU - Huang, Wenpo
AU - Jiang, Wei
AU - Li, Yanting
AU - Cho, Sugon
AU - Kim, Seoung Bum
AU - Liu, Kaibo
AU - Shi, Jianjun
AU - Jeong, Young Seon
AU - Kim, Byunghoon
AU - Tong, Seung Hoon
AU - Chang, In Kap
AU - Jeong, Myong K.
AU - Charruaud, Florent
AU - Li, Lishuai
PY - 2015/11/1
Y1 - 2015/11/1
N2 - This installment of Trends & Controversies provides an array of perspectives on the latest research in system informatics. Kang Zhao, Yao Xie, and Kwok-Leung Tsui introduce the work in 'System Informatics: From Methodology to Applications.' On the methodology side, in 'Projection-Based Process Monitoring and Empirical Divergence,' Wenpo Huang, Wei Jiang, Qingming Wei, and Yanting Li propose a framework of projection-based methods, and in 'One-Class Classification Methods for Process Monitoring and Diagnosis,' Sugon Cho and Seoung Bum Kim discuss how a data analytics algorithm can be used as a control chart. On the application side, 'IoT-Enabled System Informatics for Service Decision Making,' by Kaibo Liu and Jianjun Shi, reviews current trends and future opportunities for IoT, with a special focus on issues related to the big data collected by multiple sensors. 'Quantifying the Risk Level of Functional Chips in DRAM Wafers,' by Young-Seon Jeong, Byunghoon Kimb, Seung Hoon Tong, In-Kap Chang, and Myong K. Jeong, not only identifies research challenges and opportunities for decision making with massive data in the process of semiconductor manufacturing but also quantifies the risk level of functional chips in DRAM wafers. Finally, 'Flight Operations Monitoring through Cluster Analysis: A Case Study,' by Florent Charruaud and Lishuai Li, describes a new method called cluster-based anomaly detection to help airline safety experts monitor daily flights and detect anomalies.
AB - This installment of Trends & Controversies provides an array of perspectives on the latest research in system informatics. Kang Zhao, Yao Xie, and Kwok-Leung Tsui introduce the work in 'System Informatics: From Methodology to Applications.' On the methodology side, in 'Projection-Based Process Monitoring and Empirical Divergence,' Wenpo Huang, Wei Jiang, Qingming Wei, and Yanting Li propose a framework of projection-based methods, and in 'One-Class Classification Methods for Process Monitoring and Diagnosis,' Sugon Cho and Seoung Bum Kim discuss how a data analytics algorithm can be used as a control chart. On the application side, 'IoT-Enabled System Informatics for Service Decision Making,' by Kaibo Liu and Jianjun Shi, reviews current trends and future opportunities for IoT, with a special focus on issues related to the big data collected by multiple sensors. 'Quantifying the Risk Level of Functional Chips in DRAM Wafers,' by Young-Seon Jeong, Byunghoon Kimb, Seung Hoon Tong, In-Kap Chang, and Myong K. Jeong, not only identifies research challenges and opportunities for decision making with massive data in the process of semiconductor manufacturing but also quantifies the risk level of functional chips in DRAM wafers. Finally, 'Flight Operations Monitoring through Cluster Analysis: A Case Study,' by Florent Charruaud and Lishuai Li, describes a new method called cluster-based anomaly detection to help airline safety experts monitor daily flights and detect anomalies.
KW - after-sales service and support
KW - complex systems
KW - data analytics
KW - intelligent systems
KW - Internet of Things
KW - projection
KW - real-time monitoring
KW - service decision making
KW - system informatics
KW - system informatics
UR - http://www.scopus.com/inward/record.url?scp=84960845090&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84960845090&partnerID=8YFLogxK
U2 - 10.1109/MIS.2015.111
DO - 10.1109/MIS.2015.111
M3 - Article
AN - SCOPUS:84960845090
VL - 30
SP - 12
EP - 29
JO - IEEE Intelligent Systems
JF - IEEE Intelligent Systems
SN - 1541-1672
IS - 6
M1 - 7320917
ER -