Temperature dependent minority electron mobilities in strained si1-xgex (0. 2 < × < 0. 4) layers

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Temperature-dependent minority electron mobilities in p-type SiGe have been measured for the first time. Measurements were made on test npn SiGe/Si heterojunction bipolar transistors (HBT's) with pseudomorphic p-type Sii-a-Ge (0. 2 < x < 0. 4) base layers. Magnetotransport measurements were performed on the fabricated HBT's to obtain the minority electron mobilities in the heavily B-doped base layers for temperatures ranging from 5 to 300 K. The measured minority electron mobilities exhibited sharp increase with decreasing temperature, and also showed enhancement with decreasing base Ge composition. The cut-off frequency technique was also employed to estimate the room temperature minority electron mobilities of the alloys and the results confirmed the trend in mobilities with Ge composition as determined by the magnetotransport technique. Heterojunction bipolar transistor, minority carrier mobility, SiGe alloy.

Original languageEnglish
Pages (from-to)883-890
Number of pages8
JournalIEEE Transactions on Electron Devices
Volume47
Issue number4
DOIs
Publication statusPublished - 2000 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Temperature dependent minority electron mobilities in strained si<sub>1-x</sub>ge<sub>x</sub> (0. 2 < × < 0. 4) layers'. Together they form a unique fingerprint.

  • Cite this