Tensile test of an Al nanowire using in-situ transmission electron microscopy and its dynamic deformation behavior

Sung Hoon Kim, Hong Kyu Kim, Jong Hyun Seo, Jong Woon Lee, Dong Mok Hwang, Jae Pyoung Ahn, Jae-chul Lee

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Both the deformation behaviors and the associated structural evolution of an Al nanowire were observed by conducting tensile testing in TEM. The Al nanowire exhibited a strength close to the theoretical value and a substantial elastic limit of ∼5%. Different from bulk-forms of Al, the Al nanowire did not exhibit any quantifiable plastic strain and failed in a brittle manner. This behavior was related to the formation of deformation twins that interlock. Comparative studies were also performed using an Au nanowire to elucidate the effect that the magnitude of the stacking fault energy (SFE) has on the formation of the deformation twins and plasticity.

Original languageEnglish
Pages (from-to)386-389
Number of pages4
JournalJournal of Korean Institute of Metals and Materials
Volume54
Issue number5
DOIs
Publication statusPublished - 2016 May 1

Keywords

  • Deformation
  • Nanostructured materials
  • Nanowires
  • Transmission electron microscopy (TEM)
  • Twinning

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Modelling and Simulation
  • Surfaces, Coatings and Films
  • Metals and Alloys

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